TY - JOUR
T1 - Influence of the organic film thickness on the second order distributed feedback resonator properties of an organic semiconductor laser
AU - Bencheikh, F.
AU - Sandanayaka, A. S.D.
AU - Matsushima, T.
AU - Ribierre, Jean Charles Maurice
AU - Adachi, C.
N1 - Publisher Copyright:
© 2017 Author(s).
PY - 2017/6/21
Y1 - 2017/6/21
N2 - We report on the cavity numerical characterization of a second order one-dimensional distributed feedback organic laser. The gain medium containing 6 wt. % of 4,4′-bis[(N-carbazole)styryl]biphenyl) in a 4,4′-bis[9-dicarbazolyl]-2,2′-biphenyl) host is vacuum deposited to form an organic thin film on a SiO2 grating. The influence of the organic film thickness on the properties of the resonant cavity is investigated through numerical calculations of both the confinement factor Γ and the Q-factor. The Q-factor is obtained using two methods, one by calculating the eigenmodes of the resonant cavity and the other by calculating the reflection spectrum. It was found that while the Γ increases with the organic film thickness, the Q-factor shows a non-monotonic function with a maximum value for a thickness of 200 nm.
AB - We report on the cavity numerical characterization of a second order one-dimensional distributed feedback organic laser. The gain medium containing 6 wt. % of 4,4′-bis[(N-carbazole)styryl]biphenyl) in a 4,4′-bis[9-dicarbazolyl]-2,2′-biphenyl) host is vacuum deposited to form an organic thin film on a SiO2 grating. The influence of the organic film thickness on the properties of the resonant cavity is investigated through numerical calculations of both the confinement factor Γ and the Q-factor. The Q-factor is obtained using two methods, one by calculating the eigenmodes of the resonant cavity and the other by calculating the reflection spectrum. It was found that while the Γ increases with the organic film thickness, the Q-factor shows a non-monotonic function with a maximum value for a thickness of 200 nm.
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U2 - 10.1063/1.4986504
DO - 10.1063/1.4986504
M3 - Article
AN - SCOPUS:85021159176
SN - 0021-8979
VL - 121
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 23
M1 - 233107
ER -