TY - JOUR
T1 - Influence of vacuum chamber impurities on OLED degradation
AU - Fujimoto, Hiroshi
AU - Suekane, Takashi
AU - Imanishi, Katsuya
AU - Yukiwaki, Satoshi
AU - Wei, Hong
AU - Nagayoshi, Kaori
AU - Yahiro, Masayuki
AU - Adachi, Chihaya
N1 - Funding Information:
This work was supported in part by the International Institute for Carbon Neutral Energy Research (WPI-I2CNER) sponsored by Ministry of Education, Culture, Sports, Science and Technology (MEXT). We also acknowledge Ms. Keiko Kusuhara and Ms. Nozomi Nakamura of Kyushu University for providing the OLEDs materials. The help ofi Dr. William J. Potscavage, Jr., ofi Kyushu University in the preparation ofi this manuscript is gratefully acknowledged.
Publisher Copyright:
© (2017) by SID-the Society for Information Display. All rights reserved.
PY - 2017
Y1 - 2017
N2 - We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.
AB - We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.
UR - http://www.scopus.com/inward/record.url?scp=85044478130&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85044478130&partnerID=8YFLogxK
U2 - 10.1002/sdtp.11560
DO - 10.1002/sdtp.11560
M3 - Conference article
AN - SCOPUS:85044478130
VL - 48
SP - 9
EP - 12
JO - Digest of Technical Papers - SID International Symposium
JF - Digest of Technical Papers - SID International Symposium
SN - 0097-966X
IS - 1
T2 - SID Symposium, Seminar, and Exhibition 2017, Display Week 2017
Y2 - 21 May 2017 through 26 May 2017
ER -