Influence of vacuum chamber impurities on OLED degradation

Hiroshi Fujimoto; Takashi Suekane; Katsuya Imanishi; Satoshi Yukiwaki; Hong Wei; Kaori Nagayoshi; Masayuki Yahiro; Chihaya Adachi

doi:10.1002/sdtp.11560

Influence of vacuum chamber impurities on OLED degradation

Hiroshi Fujimoto, Takashi Suekane, Katsuya Imanishi, Satoshi Yukiwaki, Hong Wei, Kaori Nagayoshi, Masayuki Yahiro, Chihaya Adachi

Applied Chemistry

Research output: Contribution to journal › Conference article

1 Citation (Scopus)

Abstract

We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.

Original language	English
Pages (from-to)	9-12
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	48
Issue number	1
DOIs	https://doi.org/10.1002/sdtp.11560
Publication status	Published - Jan 1 2017
Event	SID Symposium, Seminar, and Exhibition 2017, Display Week 2017 - Los Angeles, United States Duration: May 21 2017 → May 26 2017

Fingerprint

All Science Journal Classification (ASJC) codes

Engineering(all)

Cite this

Fujimoto, H., Suekane, T., Imanishi, K., Yukiwaki, S., Wei, H., Nagayoshi, K., ... Adachi, C. (2017). Influence of vacuum chamber impurities on OLED degradation. Digest of Technical Papers - SID International Symposium, 48(1), 9-12. https://doi.org/10.1002/sdtp.11560

@article{4ebbe4f394984d2a8e215eadd1aaec5d,

title = "Influence of vacuum chamber impurities on OLED degradation",

abstract = "We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.",

author = "Hiroshi Fujimoto and Takashi Suekane and Katsuya Imanishi and Satoshi Yukiwaki and Hong Wei and Kaori Nagayoshi and Masayuki Yahiro and Chihaya Adachi",

year = "2017",

month = "1",

day = "1",

doi = "10.1002/sdtp.11560",

language = "English",

volume = "48",

pages = "9--12",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

number = "1",

}

TY - JOUR

T1 - Influence of vacuum chamber impurities on OLED degradation

AU - Fujimoto, Hiroshi

AU - Suekane, Takashi

AU - Imanishi, Katsuya

AU - Yukiwaki, Satoshi

AU - Wei, Hong

AU - Nagayoshi, Kaori

AU - Yahiro, Masayuki

AU - Adachi, Chihaya

PY - 2017/1/1

Y1 - 2017/1/1

N2 - We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.

AB - We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.

UR - http://www.scopus.com/inward/record.url?scp=85044478130&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85044478130&partnerID=8YFLogxK

U2 - 10.1002/sdtp.11560

DO - 10.1002/sdtp.11560

M3 - Conference article

AN - SCOPUS:85044478130

VL - 48

SP - 9

EP - 12

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

SN - 0097-966X

IS - 1

ER -

Access to Document

10.1002/sdtp.11560