Influence of vacuum chamber impurities on OLED degradation

Hiroshi Fujimoto, Takashi Suekane, Katsuya Imanishi, Satoshi Yukiwaki, Hong Wei, Kaori Nagayoshi, Masayuki Yahiro, Chihaya Adachi

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

We evaluated the influence of impurities in the vacuum chamber used for device fabrication on the lifetime ofOLEDs and found a correlation between lifetime and the device fabrication time. Our results suggest that impurities including previously deposited materials and plasticizers from the chamber components impact lifetime and reproducibility.

Original languageEnglish
Pages (from-to)9-12
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume48
Issue number1
DOIs
Publication statusPublished - Jan 1 2017
EventSID Symposium, Seminar, and Exhibition 2017, Display Week 2017 - Los Angeles, United States
Duration: May 21 2017May 26 2017

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

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