Influences of microstructure on critical current properties in MgB 2/Al Film

Yusuke Shimada, Yuuki Kubota, Satoshi Hata, Ken Ichi Ikeda, Hideharu Nakashima, Toshiya Doi, Takanori Fujiyoshi

Research output: Contribution to journalArticle

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Abstract

The metal Al is lighter in weight than other substrate materials for MgB2 films such as Si and Ni. This property inspires MgB2 fabrication on a large-scale Al substrate as a new route to MgB2 tapes. Here we report microstructural factors influencing critical current density, Jc, in MgB2/Al films. MgB2/Al films were prepared by the following steps: deposit a boron layer of 3 nm in thickness on an Al substrate heated at 280°C ; deposit Mg and boron on the boron layer (sample A). For comparison, Mg and boron were deposited directly on an Al substrate heated at 265°C (sample B). The microstructure was observed by transmission electron microscopy (TEM) and scanning TEM. Jc values at 20 K in the self-field were 4.9 × 106 A cm-2 for sample A and 2.7 × 106 A cm-2 for sample B. Both the samples form an oxygen-rich layer of 10 nm in thickness at the substrate surface. This oxygen-rich layer may suppress Al diffusion into MgB2 lattices. The [001] texture of columnar MgB2 crystals grown on the substrate is stronger in sample A than in sample B. This indicates that the boron layer deposition on the Al substrate is effective for fabricating well-textured MgB2 polycrystals, resulting in the higher J c enhancement for sample A.

Original languageEnglish
Article number6403883
JournalIEEE Transactions on Applied Superconductivity
Volume23
Issue number3
DOIs
Publication statusPublished - May 22 2013

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Critical currents
Boron
critical current
microstructure
Microstructure
Substrates
boron
Deposits
Oxygen
Transmission electron microscopy
deposits
Polycrystals
transmission electron microscopy
oxygen
Tapes
polycrystals
tapes
Textures
Metals
textures

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Influences of microstructure on critical current properties in MgB 2/Al Film. / Shimada, Yusuke; Kubota, Yuuki; Hata, Satoshi; Ikeda, Ken Ichi; Nakashima, Hideharu; Doi, Toshiya; Fujiyoshi, Takanori.

In: IEEE Transactions on Applied Superconductivity, Vol. 23, No. 3, 6403883, 22.05.2013.

Research output: Contribution to journalArticle

Shimada, Yusuke ; Kubota, Yuuki ; Hata, Satoshi ; Ikeda, Ken Ichi ; Nakashima, Hideharu ; Doi, Toshiya ; Fujiyoshi, Takanori. / Influences of microstructure on critical current properties in MgB 2/Al Film. In: IEEE Transactions on Applied Superconductivity. 2013 ; Vol. 23, No. 3.
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