Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

T. Munakata, Takeharu Sugiyama, T. Masuda, M. Aida, N. Ueno

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

Original languageEnglish
Pages (from-to)3584-3586
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number16
DOIs
Publication statusPublished - Oct 18 2004
Externally publishedYes

Fingerprint

photoelectric emission
binding energy
electronic structure
copper
spectroscopy
molecular orbitals
inhomogeneity
energy

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy. / Munakata, T.; Sugiyama, Takeharu; Masuda, T.; Aida, M.; Ueno, N.

In: Applied Physics Letters, Vol. 85, No. 16, 18.10.2004, p. 3584-3586.

Research output: Contribution to journalArticle

@article{689f381e57e845679c493830d24f95ae,
title = "Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy",
abstract = "We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.",
author = "T. Munakata and Takeharu Sugiyama and T. Masuda and M. Aida and N. Ueno",
year = "2004",
month = "10",
day = "18",
doi = "10.1063/1.1808494",
language = "English",
volume = "85",
pages = "3584--3586",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "16",

}

TY - JOUR

T1 - Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

AU - Munakata, T.

AU - Sugiyama, Takeharu

AU - Masuda, T.

AU - Aida, M.

AU - Ueno, N.

PY - 2004/10/18

Y1 - 2004/10/18

N2 - We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

AB - We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

UR - http://www.scopus.com/inward/record.url?scp=9744227962&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=9744227962&partnerID=8YFLogxK

U2 - 10.1063/1.1808494

DO - 10.1063/1.1808494

M3 - Article

AN - SCOPUS:9744227962

VL - 85

SP - 3584

EP - 3586

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 16

ER -