Inhomogeneous electronic structure of copper phthalocyanine film measured with microspot photoemission spectroscopy

T. Munakata, T. Sugiyama, T. Masuda, M. Aida, N. Ueno

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

We have applied photoemission microspectroscopy to copper phthalocyanine film grown on a polycrystalline copper with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The photoemission band due to the highest occupied molecular orbital peaked at the binding energy of either 1.6 or 1.2 eV depending on the sample positions, while the work functions were 4.3 and 4.5 eV for the respective positions. The band was intense when the binding energy was low. The results demonstrate that a large inhomogeneity exists in the interface electronic structure.

Original languageEnglish
Pages (from-to)3584-3586
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number16
DOIs
Publication statusPublished - Oct 18 2004
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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