Insulator-metal transition of VO2 ultrathin films on silicon: Evidence for an electronic origin by infrared spectroscopy

W. W. Peng, G. Niu, R. Tétot, B. Vilquin, F. Raimondi, J. B. Brubach, E. Amzallag, T. Yanagida, S. Autier-Laurent, P. Lecoeur, P. Roy

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