Interface structures of AlN/MgB2 thin films sputtered on sapphire c- and r-plane

H. Abe, M. Naito, W. J. Moon, K. Kaneko, A. Saito, Z. Wang

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


The influences of the substrates planes on the interface structures between AlN and MgB2 layers were investigated. These layers were deposited on sapphire substrate with different orientations by a conventional method. Selected-area electron diffraction patterns and high-resolution TEM were applied on the cross-sectional thinned specimens.

Original languageEnglish
Pages (from-to)2343-2346
Number of pages4
JournalJournal of Applied Physics
Issue number4
Publication statusPublished - Aug 15 2004

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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