Interferometric characterization of deep ultraviolet femtosecond pulses by multi-photon ionization/mass spectrometer

S. Zaitsu, Y. Miyoshi, S. Yamaguchi, F. Kira, T. Uchimura, T. Imasaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a novel setup rar characterizing DUV femtosecond pulses and investigating ultrafast phenomena. This allows us to directly utilize femtosecond pulses for spectroscopic applications without changing an optical alignment.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006
DOIs
Publication statusPublished - Dec 1 2006
EventConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006 - Long Beach, CA, United States
Duration: May 21 2006May 26 2006

Publication series

NameConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006

Other

OtherConference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006
CountryUnited States
CityLong Beach, CA
Period5/21/065/26/06

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Zaitsu, S., Miyoshi, Y., Yamaguchi, S., Kira, F., Uchimura, T., & Imasaka, T. (2006). Interferometric characterization of deep ultraviolet femtosecond pulses by multi-photon ionization/mass spectrometer. In Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006 [4627598] (Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference, CLEO/QELS 2006). https://doi.org/10.1109/CLEO.2006.4627598