Intrinsic surface resistance of ybco thin films under dc magnetic field

K. Nakagawa, T. Honma, K. Takeda, S. Ono, H. Kai, A. Saito, M. Mukaida, K. Nakajima, S. Ohshima

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    8 Citations (Scopus)

    Abstract

    We investigated the dc magnetic field and temperature dependences of the microwave intrinsic surface resistance (Rsint) of YBa 2Cu3Ooy (YBCO) superconducting thin films with various thicknesses. We used YBCO films from 100, 200, and 300 nm thick YBCO films deposited on CeO2/Al2O3 substrates. The (Rsint) is means the surface resistance of YBCO film without the dielectric loss of the substrates. The (Rsint) was obtained from measured surface resistance (Rs) by using a phenomenological equation. The (Rs) was measured using the dielectric resonator method at 21.8 GHz. A dc magnetic field of up to 5.0 T was applied parallel to the c-axis of the superconducting thin films during the (R s) measurements. The (Rsint) of the YBCO thin films increased when the dc magnetic field was applied. These relations could be explained with the two-fluid model for high-frequency and high-magnetic field limits. The (Rsint) ratio (defined as (Rs int) (5T)/ (Rsint) (OT) slightly decreased with the film thickness. These results indicate that the (Rs int) of HTS films depends on the film thickness in the dc magnetic field and the (Rsint) in a dc magnetic field may be related to the pinning center in the HTS films.

    Original languageEnglish
    Article number5621861
    Pages (from-to)587-590
    Number of pages4
    JournalIEEE Transactions on Applied Superconductivity
    Volume21
    Issue number3 PART 1
    DOIs
    Publication statusPublished - Jun 2011

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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