Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy

Yasumasa Suzuki; Hirotoshi Enoki; Etsuo Akiba

doi:10.1016/j.ultramic.2003.12.008

Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy

Yasumasa Suzuki, Hirotoshi Enoki, Etsuo Akiba

Hydrogen Utilization Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.

Original language	English
Pages (from-to)	221-226
Number of pages	6
Journal	Ultramicroscopy
Volume	99
Issue number	4
DOIs	https://doi.org/10.1016/j.ultramic.2003.12.008
Publication status	Published - Jun 1 2004

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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abstract = "Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.",

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AU - Suzuki, Yasumasa

AU - Enoki, Hirotoshi

AU - Akiba, Etsuo

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N2 - Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.

AB - Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.

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