Abstract
Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.
| Original language | English |
|---|---|
| Pages (from-to) | 221-226 |
| Number of pages | 6 |
| Journal | Ultramicroscopy |
| Volume | 99 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Jun 1 2004 |
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All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Instrumentation
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Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy. / Suzuki, Yasumasa; Enoki, Hirotoshi; Akiba, Etsuo.
In: Ultramicroscopy, Vol. 99, No. 4, 01.06.2004, p. 221-226.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy
AU - Suzuki, Yasumasa
AU - Enoki, Hirotoshi
AU - Akiba, Etsuo
PY - 2004/6/1
Y1 - 2004/6/1
N2 - Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.
AB - Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.
UR - http://www.scopus.com/inward/record.url?scp=2442688155&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=2442688155&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2003.12.008
DO - 10.1016/j.ultramic.2003.12.008
M3 - Article
C2 - 15149716
AN - SCOPUS:2442688155
VL - 99
SP - 221
EP - 226
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
IS - 4
ER -