Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy

Yasumasa Suzuki, Hirotoshi Enoki, Etsuo Akiba

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Resonance measurements and atomic force microscopy (AFM) observations were carried out by the non-contact AFM operating in various gas atmospheres (hydrogen, helium, nitrogen and argon) over the range of pressures from 0.1 to 1.1MPa. In each atmosphere, the resonance frequency of the AFM cantilever depended on the pressure of gases studied. The plots of the relative resonance frequency at a constant pressure vs. the gas density gave a straight line. It was found that the characteristic of the resonance frequency for the AFM cantilever were dependent on the density of the gas species. The resolution of the AFM was hardly influenced by the gas atmosphere under the present experimental conditions.

Original languageEnglish
Pages (from-to)221-226
Number of pages6
JournalUltramicroscopy
Volume99
Issue number4
DOIs
Publication statusPublished - Jun 1 2004

Fingerprint

Atomic force microscopy
Gases
atomic force microscopy
atmospheres
gases
helium hydrogen atmospheres
Density of gases
Helium
Argon
gas density
Hydrogen
Nitrogen
plots
argon
nitrogen

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Instrumentation

Cite this

Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy. / Suzuki, Yasumasa; Enoki, Hirotoshi; Akiba, Etsuo.

In: Ultramicroscopy, Vol. 99, No. 4, 01.06.2004, p. 221-226.

Research output: Contribution to journalArticle

Suzuki, Yasumasa ; Enoki, Hirotoshi ; Akiba, Etsuo. / Investigation of influence of gas atmosphere and pressure upon non-contact atomic force microscopy. In: Ultramicroscopy. 2004 ; Vol. 99, No. 4. pp. 221-226.
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