Investigation of phase transition behaviors of organosilane monolayers by grazing incidence X-ray diffraction measurement at various temperatures

Tomoyuki Koga, Sono Sasaki, Osami Sakata, Hideyuki Otsuka, Atsushi Takahara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Phase transition behavior of docosyltrichlorosilane (DOTS) and octadecyltrichlorosilane (OTS) monolayers prepared on Si-wafer surface was investigated based on in plane grazing incidence X-ray diffraction (in plane GIXD) at various temperatures. The DOTS and OTS monolayer was prepared by a water-cast method (DOTS-W) and chemisorption method (OTS-S), respectively. The temperature dependent in plane GIXD measurements clarified that crystalline state of DOTS-W monolayer changes from rectangular phase to hexagonal one with an increase in temperature. An estimated linear thermal expansion coefficient of rectangular DOTS-W monolayer assigned a similar value of bulk polyethylene. The OTS-S monolayer also changed from hexagonal lattice to amorphous state above a melting point of octadecyl groups.

Original languageEnglish
Title of host publication54th SPSJ Annual Meeting 2005 - Polymer Preprints, Japan
Number of pages1
Volume54
Edition1
Publication statusPublished - Dec 1 2005
Event54th SPSJ Annual Meeting 2005 - Yokohama, Japan
Duration: May 25 2005May 27 2005

Other

Other54th SPSJ Annual Meeting 2005
CountryJapan
CityYokohama
Period5/25/055/27/05

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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    Koga, T., Sasaki, S., Sakata, O., Otsuka, H., & Takahara, A. (2005). Investigation of phase transition behaviors of organosilane monolayers by grazing incidence X-ray diffraction measurement at various temperatures. In 54th SPSJ Annual Meeting 2005 - Polymer Preprints, Japan (1 ed., Vol. 54)