Investigation on transport properties of strained La 0.85 Ba 0.15 MnO 3 thin films using hall measurement

Teruo Kanki, Takeshi Yanagida, Bertrand Vilquin, Hidekazu Tanaka, Tomoji Kawai

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

La 1-x Ba x MnO 3 thin films (0.05 ≤ x ≤ 0.2) with a tensile strain from substrate exhibit unusual film thickness dependence on the Curie temperature T C . The T C was found to increase up to room temperature with decreasing film thickness. In this study, the origin of the T C enhancement is examined by performing Hall measurements. The carrier densities of various thick films were found to be almost constant value (∼6 × 10 20 cm -3 ) at 10 K, whereas Hall mobility drastically increased, from 5 cm 2 /V s for 729-nm thick film to 50 cm 2 /V s for 24-nm thick film. These results indicate that the T C enhancement is induced by increase of carrier transfer due to lattice deformation of Mn-O-Mn networks.

Original languageEnglish
Pages (from-to)481-484
Number of pages4
JournalApplied Surface Science
Volume244
Issue number1-4
DOIs
Publication statusPublished - May 15 2005
Externally publishedYes
Event12th International Conference on Solid Films and Surfaces - Hammatsu, Japan
Duration: Jun 21 2004Jun 25 2004

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Thick films
Transport properties
Thin films
Film thickness
Hall mobility
Tensile strain
Curie temperature
Carrier concentration
Substrates
Temperature

All Science Journal Classification (ASJC) codes

  • Surfaces, Coatings and Films

Cite this

Investigation on transport properties of strained La 0.85 Ba 0.15 MnO 3 thin films using hall measurement . / Kanki, Teruo; Yanagida, Takeshi; Vilquin, Bertrand; Tanaka, Hidekazu; Kawai, Tomoji.

In: Applied Surface Science, Vol. 244, No. 1-4, 15.05.2005, p. 481-484.

Research output: Contribution to journalConference article

Kanki, Teruo ; Yanagida, Takeshi ; Vilquin, Bertrand ; Tanaka, Hidekazu ; Kawai, Tomoji. / Investigation on transport properties of strained La 0.85 Ba 0.15 MnO 3 thin films using hall measurement In: Applied Surface Science. 2005 ; Vol. 244, No. 1-4. pp. 481-484.
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AU - Kawai, Tomoji

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