Invited paper: Enhanced long-term stabilities in fluorescent and phosphorescent organic light emitting device

Hideyuki Murata, Toshinori Matsushima

Research output: Contribution to journalConference article

Abstract

In this paper, we have investigate that the degradation mechanism of OLEDs using Alq3 and FIrpic as emitting materials. For the Alq3 device, ultra-thin layers of MoO3 significantly enhance the device durability. The optimized MoO3 thickness was 0.75 nm, realizing the lowest voltage and the longest lifetime. We found that the device stabilities strongly depend on the process pressure during the device fabrication. In both fluorescent and phosphorescent emitting materials, the devices fabricated under UHV conditions demonstrated excellent long-term stabilities.

Original languageEnglish
Pages (from-to)685-686
Number of pages2
JournalDigest of Technical Papers - SID International Symposium
Volume40
Issue number1
DOIs
Publication statusPublished - Jan 1 2009
Externally publishedYes
Event2009 Vehicles and Photons Symposium - Dearborn, MI, United States
Duration: Oct 15 2009Oct 16 2009

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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