In this paper, we have investigate that the degradation mechanism of OLEDs using Alq3 and FIrpic as emitting materials. For the Alq3 device, ultra-thin layers of MoO3 significantly enhance the device durability. The optimized MoO3 thickness was 0.75 nm, realizing the lowest voltage and the longest lifetime. We found that the device stabilities strongly depend on the process pressure during the device fabrication. In both fluorescent and phosphorescent emitting materials, the devices fabricated under UHV conditions demonstrated excellent long-term stabilities.
|Number of pages||2|
|Journal||Digest of Technical Papers - SID International Symposium|
|Publication status||Published - Jan 1 2009|
|Event||2009 Vehicles and Photons Symposium - Dearborn, MI, United States|
Duration: Oct 15 2009 → Oct 16 2009
All Science Journal Classification (ASJC) codes