TY - GEN
T1 - Irregularities in candidates selection of multi-aimed university entrance examinations
AU - Suzuki, Takahiko
AU - Michiwaki, Takeshi
AU - Ayukawa, Keiji
AU - Ishimaru, Michiyo
AU - Mori, Seiichi
PY - 2013/12/16
Y1 - 2013/12/16
N2 - In Japanese university entrance examinations, examinee is sometimes allowed to aim at two or more departments per single entrance examination opportunity. We call such an examination a 'emulti-aimed' examination. We define the model of a 'emulti-aimed' examination and list the requirements that should be satisfied in selecting successful candidates on multi-aimed examinations. We show that there are certain drawbacks in the traditional method of selection.
AB - In Japanese university entrance examinations, examinee is sometimes allowed to aim at two or more departments per single entrance examination opportunity. We call such an examination a 'emulti-aimed' examination. We define the model of a 'emulti-aimed' examination and list the requirements that should be satisfied in selecting successful candidates on multi-aimed examinations. We show that there are certain drawbacks in the traditional method of selection.
UR - http://www.scopus.com/inward/record.url?scp=84890022890&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84890022890&partnerID=8YFLogxK
U2 - 10.1109/IIAI-AAI.2013.80
DO - 10.1109/IIAI-AAI.2013.80
M3 - Conference contribution
AN - SCOPUS:84890022890
SN - 9780769550718
T3 - Proceedings - 2nd IIAI International Conference on Advanced Applied Informatics, IIAI-AAI 2013
SP - 211
EP - 216
BT - Proceedings - 2nd IIAI International Conference on Advanced Applied Informatics, IIAI-AAI 2013
T2 - 2nd IIAI International Conference on Advanced Applied Informatics, IIAI-AAI 2013
Y2 - 31 August 2013 through 4 September 2013
ER -