Lattice defect behavior of LaNi4.97Sn0.27 during hydrogenation cycles

Kouji Sakaki, Yumiko Nakamura, Yasuharu Shirai, Robert C. Bowman, Etsuo Akiba

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Lattice defect behavior of LaNi4.97Sn0.27 during the hydrogenation cycles has been investigated by in-situ positron lifetime measurement. Mean positron lifetime increased and decreased by each hydrogenation and dehydrogenation, respectively, independently of the hydrogenation cycles. It suggests that lattice defects are introduced by the hydrogenation and removed from the lattice by the dehydrogenation even at below the migration temperature of vacancy in LaNi5. Furthermore, dislocation density and vacancy concentration kept almost constant at the value of around 6 × 109 cm-2 and 10ppm through at least eight hydrogenation/dehydrogenation cycles.

Original languageEnglish
Pages (from-to)1875-1877
Number of pages3
JournalMaterials Transactions
Volume47
Issue number8
DOIs
Publication statusPublished - Aug 1 2006

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Lattice defect behavior of LaNi<sub>4.97</sub>Sn<sub>0.27</sub> during hydrogenation cycles'. Together they form a unique fingerprint.

  • Cite this

    Sakaki, K., Nakamura, Y., Shirai, Y., Bowman, R. C., & Akiba, E. (2006). Lattice defect behavior of LaNi4.97Sn0.27 during hydrogenation cycles. Materials Transactions, 47(8), 1875-1877. https://doi.org/10.2320/matertrans.47.1875