Levels of detail control based on correlation analysis between surface position and direction

Tokuo Tsuji, Hongbin Zha, Tsutomu Hasegawa, Ryo Kurazume

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

This paper presents a new LOD control method using surface smoothness measure based on correlation analysis between surface position and direction. This control method renders smooth surface with less data. We also describe a new method of generating hierarchical data structures of face clusters.

Original languageEnglish
Title of host publicationProceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
EditorsJ. Kittler, M. Petrou, M. Nixon
Pages622-625
Number of pages4
DOIs
Publication statusPublished - Dec 20 2004
EventProceedings of the 17th International Conference on Pattern Recognition, ICPR 2004 - Cambridge, United Kingdom
Duration: Aug 23 2004Aug 26 2004

Publication series

NameProceedings - International Conference on Pattern Recognition
Volume3
ISSN (Print)1051-4651

Other

OtherProceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
CountryUnited Kingdom
CityCambridge
Period8/23/048/26/04

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition

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  • Cite this

    Tsuji, T., Zha, H., Hasegawa, T., & Kurazume, R. (2004). Levels of detail control based on correlation analysis between surface position and direction. In J. Kittler, M. Petrou, & M. Nixon (Eds.), Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004 (pp. 622-625). (Proceedings - International Conference on Pattern Recognition; Vol. 3). https://doi.org/10.1109/ICPR.2004.1334606