Abstract
In this paper we prove the logarithmic Sobolev inequality on pinned loop groups over compact Lie groups equipped with H0s-metric (s > 1/2). We also compute the Ricci tensor with respect to H0 s-metric and investigate its asymptotic behavior as s decreases to 1/2.
| Original language | English |
|---|---|
| Pages (from-to) | 1-26 |
| Number of pages | 26 |
| Journal | Infinite Dimensional Analysis, Quantum Probability and Related Topics |
| Volume | 7 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Mar 1 2004 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Statistical and Nonlinear Physics
- Statistics and Probability
- Mathematical Physics
- Applied Mathematics
Cite this
Logarithmic Sobolev inequality for H0s-metric on pinned loop groups. / Inahama, Yuzuru.
In: Infinite Dimensional Analysis, Quantum Probability and Related Topics, Vol. 7, No. 1, 01.03.2004, p. 1-26.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Logarithmic Sobolev inequality for H0s-metric on pinned loop groups
AU - Inahama, Yuzuru
PY - 2004/3/1
Y1 - 2004/3/1
N2 - In this paper we prove the logarithmic Sobolev inequality on pinned loop groups over compact Lie groups equipped with H0s-metric (s > 1/2). We also compute the Ricci tensor with respect to H0 s-metric and investigate its asymptotic behavior as s decreases to 1/2.
AB - In this paper we prove the logarithmic Sobolev inequality on pinned loop groups over compact Lie groups equipped with H0s-metric (s > 1/2). We also compute the Ricci tensor with respect to H0 s-metric and investigate its asymptotic behavior as s decreases to 1/2.
UR - http://www.scopus.com/inward/record.url?scp=7444228027&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=7444228027&partnerID=8YFLogxK
U2 - 10.1142/S0219025704001505
DO - 10.1142/S0219025704001505
M3 - Article
AN - SCOPUS:7444228027
VL - 7
SP - 1
EP - 26
JO - Infinite Dimensional Analysis, Quantum Probability and Related Topics
JF - Infinite Dimensional Analysis, Quantum Probability and Related Topics
SN - 0219-0257
IS - 1
ER -