Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips

Seigi Mizuno; F. Rahman; Masayuki Iwanaga

doi:10.1143/JJAP.45.L178

Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips

Seigi Mizuno, F. Rahman, Masayuki Iwanaga

Research output: Contribution to journal › Article › peer-review

18 Citations (Scopus)

Abstract

We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.

Original language	English
Pages (from-to)	L178-L179
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	45
Issue number	4-7
DOIs	https://doi.org/10.1143/JJAP.45.L178
Publication status	Published - Feb 3 2006

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy (miscellaneous)
Physics and Astronomy(all)

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10.1143/JJAP.45.L178

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abstract = "We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.",

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AU - Rahman, F.

AU - Iwanaga, Masayuki

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N2 - We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.

AB - We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.

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ER -

Low-energy electron diffraction patterns using field-emitted electrons from tungsten tips

Abstract

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