We have observed low-energy electron diffraction patterns of Cu(001) clean surface using field-emitted electrons from tungsten tips. Only elastically scattered electrons contribute to diffraction patterns. Tip-sample distance, bias voltage, electron beam opening angle and tip apex structure determine the probing diameter and symmetry of diffraction patterns. The emission current, bias voltage and estimated probing diameter for the observed diffraction patterns were 0.15nA, 75-82V, and 4-40 μm, respectively.
|Journal||Japanese Journal of Applied Physics, Part 2: Letters|
|Publication status||Published - Feb 3 2006|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
- Physics and Astronomy(all)