TY - GEN
T1 - Low-temperature epitaxial growth of [Fe3Si/SiGe]n (n=1-2) multi-layered structures for spintronics application
AU - Sadoh, T.
AU - Ueda, K.
AU - Ando, Y.
AU - Kumano, M.
AU - Narumi, K.
AU - Maeda, Y.
AU - Miyao, M.
PY - 2007/12/1
Y1 - 2007/12/1
N2 - Our recent progresses in epitaxial growth of Fe3Si on Ge substrates are reviewed. Single crystalline Fe3Si layers with atomically flat interfaces were achieved on Ge(111) substrates by optimizing growth conditions at low temperatires (60-200°C), Thermal stability of it was guaranteed up to 400°C In addition, epitaxial growth of mixed layers composed of Fs3Si, FeGe, and FeSi on Ge substrates at 400°C is reported. Finally, epitaxial growth of Fe3Si/Ge/Fe3Si/Ge structures is discussed. These results will be a powerful tool to open up SiGe related spintronics.
AB - Our recent progresses in epitaxial growth of Fe3Si on Ge substrates are reviewed. Single crystalline Fe3Si layers with atomically flat interfaces were achieved on Ge(111) substrates by optimizing growth conditions at low temperatires (60-200°C), Thermal stability of it was guaranteed up to 400°C In addition, epitaxial growth of mixed layers composed of Fs3Si, FeGe, and FeSi on Ge substrates at 400°C is reported. Finally, epitaxial growth of Fe3Si/Ge/Fe3Si/Ge structures is discussed. These results will be a powerful tool to open up SiGe related spintronics.
UR - http://www.scopus.com/inward/record.url?scp=45749108978&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=45749108978&partnerID=8YFLogxK
U2 - 10.1149/1.2778404
DO - 10.1149/1.2778404
M3 - Conference contribution
AN - SCOPUS:45749108978
SN - 9781566775724
T3 - ECS Transactions
SP - 473
EP - 479
BT - ECS Transactions - 5th International Symposium on ULSI Process Integration
T2 - 5th International Symposium on ULSI Process Integration - 212th ECS Meeting
Y2 - 7 October 2007 through 12 October 2007
ER -