Low-temperature oriented growth in [CoPt/MgO] n multi-layer

Taizoh Sadoh, M. Kurosawa, M. Kimura, K. Ueda, M. Koyanagi, M. Miyao

Research output: Contribution to journalArticle

Abstract

Oriented-crystal growth of CoPt and MgO layers in the [CoPt/MgO] n stacked structures at low-temperatures (< 650 °C) was investigated. For the CoPt (thickness: 40 nm)/MgO (50 nm) structures formed on Si(100) substrates, X-ray diffraction measurements revealed formation of poly-CoPt with random orientations and amorphous MgO. On the other hand, CoPt(111) and MgO(111) layers were dominantly obtained for the [CoPt (4 nm)/MgO (5 nm)] 10 /Si(100) and [CoPt (2 nm)/MgO (2.5 nm)] 20 /Si(100) structures. The (111) oriented growth of CoPt layers was found to be due to the template effect of MgO layers, which were crystallized to the (111) orientation if the layers were thin (< 5 nm).

Original languageEnglish
Pages (from-to)430-433
Number of pages4
JournalThin Solid Films
Volume517
Issue number1
DOIs
Publication statusPublished - Nov 3 2008

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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    Sadoh, T., Kurosawa, M., Kimura, M., Ueda, K., Koyanagi, M., & Miyao, M. (2008). Low-temperature oriented growth in [CoPt/MgO] n multi-layer Thin Solid Films, 517(1), 430-433. https://doi.org/10.1016/j.tsf.2008.08.057