Magnetic circular dichroism study of ultrathin Ni films by threshold photoemission and angle resolved photoemission spectroscopy

Takeshi Nakagawa; Isamu Yamamoto; Yasumasa Takagi; Toshihiko Yokoyama

doi:10.1016/j.elspec.2010.04.009

Magnetic circular dichroism study of ultrathin Ni films by threshold photoemission and angle resolved photoemission spectroscopy

Takeshi Nakagawa, Isamu Yamamoto, Yasumasa Takagi, Toshihiko Yokoyama

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Threshold photoemission magnetic circular dichroism (MCD) for 12 monolayer (ML) Ni thin films grown on Cu(0 0 1) was measured with a total electron yield method. The obtained MCD asymmetry using the total electron yield method reaches as much as 10% near the photoemission threshold. On the other hand, the MCD asymmetry in angle resolved photoemission spectra with the photon energy of 5.28 eV was also investigated for Cs/Ni(12 ML)/Cu(0 0 1) and was found to give a similar MCD asymmetry. The high MCD asymmetry in the total electron yield can be interpreted by the argument that the angle and energy selection is spontaneously achieved in the total electron yield near the photoemission threshold for low photon energy excitation.

Original language	English
Pages (from-to)	164-167
Number of pages	4
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	181
Issue number	2-3
DOIs	https://doi.org/10.1016/j.elspec.2010.04.009
Publication status	Published - Aug 2010
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/j.elspec.2010.04.009

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title = "Magnetic circular dichroism study of ultrathin Ni films by threshold photoemission and angle resolved photoemission spectroscopy",

abstract = "Threshold photoemission magnetic circular dichroism (MCD) for 12 monolayer (ML) Ni thin films grown on Cu(0 0 1) was measured with a total electron yield method. The obtained MCD asymmetry using the total electron yield method reaches as much as 10% near the photoemission threshold. On the other hand, the MCD asymmetry in angle resolved photoemission spectra with the photon energy of 5.28 eV was also investigated for Cs/Ni(12 ML)/Cu(0 0 1) and was found to give a similar MCD asymmetry. The high MCD asymmetry in the total electron yield can be interpreted by the argument that the angle and energy selection is spontaneously achieved in the total electron yield near the photoemission threshold for low photon energy excitation.",

author = "Takeshi Nakagawa and Isamu Yamamoto and Yasumasa Takagi and Toshihiko Yokoyama",

year = "2010",

month = aug,

doi = "10.1016/j.elspec.2010.04.009",

language = "English",

volume = "181",

pages = "164--167",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier",

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TY - JOUR

T1 - Magnetic circular dichroism study of ultrathin Ni films by threshold photoemission and angle resolved photoemission spectroscopy

AU - Nakagawa, Takeshi

AU - Yamamoto, Isamu

AU - Takagi, Yasumasa

AU - Yokoyama, Toshihiko

PY - 2010/8

Y1 - 2010/8

N2 - Threshold photoemission magnetic circular dichroism (MCD) for 12 monolayer (ML) Ni thin films grown on Cu(0 0 1) was measured with a total electron yield method. The obtained MCD asymmetry using the total electron yield method reaches as much as 10% near the photoemission threshold. On the other hand, the MCD asymmetry in angle resolved photoemission spectra with the photon energy of 5.28 eV was also investigated for Cs/Ni(12 ML)/Cu(0 0 1) and was found to give a similar MCD asymmetry. The high MCD asymmetry in the total electron yield can be interpreted by the argument that the angle and energy selection is spontaneously achieved in the total electron yield near the photoemission threshold for low photon energy excitation.

AB - Threshold photoemission magnetic circular dichroism (MCD) for 12 monolayer (ML) Ni thin films grown on Cu(0 0 1) was measured with a total electron yield method. The obtained MCD asymmetry using the total electron yield method reaches as much as 10% near the photoemission threshold. On the other hand, the MCD asymmetry in angle resolved photoemission spectra with the photon energy of 5.28 eV was also investigated for Cs/Ni(12 ML)/Cu(0 0 1) and was found to give a similar MCD asymmetry. The high MCD asymmetry in the total electron yield can be interpreted by the argument that the angle and energy selection is spontaneously achieved in the total electron yield near the photoemission threshold for low photon energy excitation.

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JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - 2-3

ER -

Magnetic circular dichroism study of ultrathin Ni films by threshold photoemission and angle resolved photoemission spectroscopy

Abstract

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