Magnetic impurity effect in atomic sized conductor

Koichiro Ienaga, Naoya Nakashima, Yuji Inagaki, Tatsuya Kawae, Hiroyuki Tsujii

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have studied the electrical conductance in Au nanowire containing 0.07 at.% Fe ions and Cu nanowire containing 13 at.% Mn ions with mechanically controllable break junction technique to investigate the magnetic impurity effects in the atomic-sized conductance. We observe not only conductance steps at the integer multiples of G0 = 2e2/h, but also steps deviating from them. The scattering between the conduction electrons and impurity ions lifts the spin degeneracy of the transmission probability, which may be responsible for the deviation.

Original languageEnglish
Title of host publicationTENCON 2010 - 2010 IEEE Region 10 Conference
Pages1885-1887
Number of pages3
DOIs
Publication statusPublished - 2010
Event2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, Japan
Duration: Nov 21 2010Nov 24 2010

Other

Other2010 IEEE Region 10 Conference, TENCON 2010
CountryJapan
CityFukuoka
Period11/21/1011/24/10

Fingerprint

Impurities
Nanowires
Ions
Scattering
Electrons

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Computer Science Applications

Cite this

Ienaga, K., Nakashima, N., Inagaki, Y., Kawae, T., & Tsujii, H. (2010). Magnetic impurity effect in atomic sized conductor. In TENCON 2010 - 2010 IEEE Region 10 Conference (pp. 1885-1887). [5686395] https://doi.org/10.1109/TENCON.2010.5686395

Magnetic impurity effect in atomic sized conductor. / Ienaga, Koichiro; Nakashima, Naoya; Inagaki, Yuji; Kawae, Tatsuya; Tsujii, Hiroyuki.

TENCON 2010 - 2010 IEEE Region 10 Conference. 2010. p. 1885-1887 5686395.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ienaga, K, Nakashima, N, Inagaki, Y, Kawae, T & Tsujii, H 2010, Magnetic impurity effect in atomic sized conductor. in TENCON 2010 - 2010 IEEE Region 10 Conference., 5686395, pp. 1885-1887, 2010 IEEE Region 10 Conference, TENCON 2010, Fukuoka, Japan, 11/21/10. https://doi.org/10.1109/TENCON.2010.5686395
Ienaga K, Nakashima N, Inagaki Y, Kawae T, Tsujii H. Magnetic impurity effect in atomic sized conductor. In TENCON 2010 - 2010 IEEE Region 10 Conference. 2010. p. 1885-1887. 5686395 https://doi.org/10.1109/TENCON.2010.5686395
Ienaga, Koichiro ; Nakashima, Naoya ; Inagaki, Yuji ; Kawae, Tatsuya ; Tsujii, Hiroyuki. / Magnetic impurity effect in atomic sized conductor. TENCON 2010 - 2010 IEEE Region 10 Conference. 2010. pp. 1885-1887
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