Magnetic impurity effect in atomic sized conductor

Koichiro Ienaga; Naoya Nakashima; Yuji Inagaki; Tatsuya Kawae; Hiroyuki Tsujii

doi:10.1109/TENCON.2010.5686395

Magnetic impurity effect in atomic sized conductor

Koichiro Ienaga, Naoya Nakashima, Yuji Inagaki, Tatsuya Kawae, Hiroyuki Tsujii

Applied Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We have studied the electrical conductance in Au nanowire containing 0.07 at.% Fe ions and Cu nanowire containing 13 at.% Mn ions with mechanically controllable break junction technique to investigate the magnetic impurity effects in the atomic-sized conductance. We observe not only conductance steps at the integer multiples of G₀ = 2e²/h, but also steps deviating from them. The scattering between the conduction electrons and impurity ions lifts the spin degeneracy of the transmission probability, which may be responsible for the deviation.

Original language	English
Title of host publication	TENCON 2010 - 2010 IEEE Region 10 Conference
Pages	1885-1887
Number of pages	3
DOIs	https://doi.org/10.1109/TENCON.2010.5686395
Publication status	Published - 2010
Event	2010 IEEE Region 10 Conference, TENCON 2010 - Fukuoka, Japan Duration: Nov 21 2010 → Nov 24 2010

Other

Other	2010 IEEE Region 10 Conference, TENCON 2010
Country	Japan
City	Fukuoka
Period	11/21/10 → 11/24/10

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Computer Science Applications

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10.1109/TENCON.2010.5686395

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title = "Magnetic impurity effect in atomic sized conductor",

abstract = "We have studied the electrical conductance in Au nanowire containing 0.07 at.% Fe ions and Cu nanowire containing 13 at.% Mn ions with mechanically controllable break junction technique to investigate the magnetic impurity effects in the atomic-sized conductance. We observe not only conductance steps at the integer multiples of G0 = 2e2/h, but also steps deviating from them. The scattering between the conduction electrons and impurity ions lifts the spin degeneracy of the transmission probability, which may be responsible for the deviation.",

author = "Koichiro Ienaga and Naoya Nakashima and Yuji Inagaki and Tatsuya Kawae and Hiroyuki Tsujii",

year = "2010",

doi = "10.1109/TENCON.2010.5686395",

language = "English",

isbn = "9781424468904",

pages = "1885--1887",

booktitle = "TENCON 2010 - 2010 IEEE Region 10 Conference",

note = "2010 IEEE Region 10 Conference, TENCON 2010 ; Conference date: 21-11-2010 Through 24-11-2010",

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TY - GEN

T1 - Magnetic impurity effect in atomic sized conductor

AU - Ienaga, Koichiro

AU - Nakashima, Naoya

AU - Inagaki, Yuji

AU - Kawae, Tatsuya

AU - Tsujii, Hiroyuki

PY - 2010

Y1 - 2010

N2 - We have studied the electrical conductance in Au nanowire containing 0.07 at.% Fe ions and Cu nanowire containing 13 at.% Mn ions with mechanically controllable break junction technique to investigate the magnetic impurity effects in the atomic-sized conductance. We observe not only conductance steps at the integer multiples of G0 = 2e2/h, but also steps deviating from them. The scattering between the conduction electrons and impurity ions lifts the spin degeneracy of the transmission probability, which may be responsible for the deviation.

AB - We have studied the electrical conductance in Au nanowire containing 0.07 at.% Fe ions and Cu nanowire containing 13 at.% Mn ions with mechanically controllable break junction technique to investigate the magnetic impurity effects in the atomic-sized conductance. We observe not only conductance steps at the integer multiples of G0 = 2e2/h, but also steps deviating from them. The scattering between the conduction electrons and impurity ions lifts the spin degeneracy of the transmission probability, which may be responsible for the deviation.

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U2 - 10.1109/TENCON.2010.5686395

DO - 10.1109/TENCON.2010.5686395

M3 - Conference contribution

AN - SCOPUS:79951614199

SN - 9781424468904

SP - 1885

EP - 1887

BT - TENCON 2010 - 2010 IEEE Region 10 Conference

T2 - 2010 IEEE Region 10 Conference, TENCON 2010

Y2 - 21 November 2010 through 24 November 2010

ER -

Magnetic impurity effect in atomic sized conductor

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