A new magnetic microprobe is proposed for nondestructive defects imaging of conductors or magnetic materials with submillimeter resolution. The probe consists of a pair of thin amorphous wire cores bent in the U-shape and four identical copper wire coils wound on the wire cores.
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 1999|
|Event||Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea|
Duration: May 18 1999 → May 21 1999
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering