Magnetization process and resistance jumps in a submicron-scale cross-shaped Co wire

The magnetization processes of a submicron-width Co wire with two micron-width crossing probes were investigated by measuring Hall resistance (HR) and magnetoresistance (MR). Three clear jumps and two jumps were observed in the HR and MR, respectively. In order to explain the observed jumps, the magnetization process of the crossing region where the probes cross the wire was calculated by considering the exchange interactions from the current and voltage probes. The calculated HR reproduced the observed three clear jumps. The observed MR can be explained by the anisotropic MR of the crossing region and the contribution of a domain wall. The HR jumps could be related to the discrete changes of the magnetizations in the probes.