Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system

Seiya Abe; Kentaro Fukushima; Sihun Yang; Mariko Ogawa; Kosuke Nomura; Masahito Shoyama; Tamotsu Ninomiya; Akira Matsumoto; Akiyoshi Fukui; Mikio Yamasaki

doi:10.1109/ECCE.2010.5617785

Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system

Seiya Abe, Kentaro Fukushima, Sihun Yang, Mariko Ogawa, Kosuke Nomura, Masahito Shoyama, Tamotsu Ninomiya, Akira Matsumoto, Akiyoshi Fukui, Mikio Yamasaki

Applied Energy Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.

Original language	English
Title of host publication	2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings
Pages	3733-3738
Number of pages	6
DOIs	https://doi.org/10.1109/ECCE.2010.5617785
Publication status	Published - 2010
Event	2010 2nd IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Atlanta, GA, United States Duration: Sep 12 2010 → Sep 16 2010

Other

Other	2010 2nd IEEE Energy Conversion Congress and Exposition, ECCE 2010
Country/Territory	United States
City	Atlanta, GA
Period	9/12/10 → 9/16/10

All Science Journal Classification (ASJC) codes

Energy Engineering and Power Technology
Renewable Energy, Sustainability and the Environment

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1109/ECCE.2010.5617785

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Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system. / Abe, Seiya; Fukushima, Kentaro; Yang, Sihun; Ogawa, Mariko; Nomura, Kosuke; Shoyama, Masahito; Ninomiya, Tamotsu; Matsumoto, Akira; Fukui, Akiyoshi; Yamasaki, Mikio.

2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings. 2010. p. 3733-3738 5617785.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abe, S, Fukushima, K, Yang, S, Ogawa, M, Nomura, K, Shoyama, M, Ninomiya, T, Matsumoto, A, Fukui, A & Yamasaki, M 2010, Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system. in 2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings., 5617785, pp. 3733-3738, 2010 2nd IEEE Energy Conversion Congress and Exposition, ECCE 2010, Atlanta, GA, United States, 9/12/10. https://doi.org/10.1109/ECCE.2010.5617785

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abstract = "This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.",

author = "Seiya Abe and Kentaro Fukushima and Sihun Yang and Mariko Ogawa and Kosuke Nomura and Masahito Shoyama and Tamotsu Ninomiya and Akira Matsumoto and Akiyoshi Fukui and Mikio Yamasaki",

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doi = "10.1109/ECCE.2010.5617785",

language = "English",

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AU - Abe, Seiya

AU - Fukushima, Kentaro

AU - Yang, Sihun

AU - Ogawa, Mariko

AU - Nomura, Kosuke

AU - Shoyama, Masahito

AU - Ninomiya, Tamotsu

AU - Matsumoto, Akira

AU - Fukui, Akiyoshi

AU - Yamasaki, Mikio

PY - 2010

Y1 - 2010

N2 - This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.

AB - This paper considers the malfunction mechanism of semiconductor circuit breaker in high voltage DC power supply system (HVDC). In HVDC system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction is happened, unexpected large current is flown to the other normal line. In this paper, the malfunction mechanism of semiconductor circuit breaker is considered. It demonstrated by using MATLAB/Simulink. Moreover, the demonstrated results are confirmed by experimentally.

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BT - 2010 IEEE Energy Conversion Congress and Exposition, ECCE 2010 - Proceedings

T2 - 2010 2nd IEEE Energy Conversion Congress and Exposition, ECCE 2010

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ER -

Malfunction mechanism of semiconductor circuit breaker in HVDC power supply system

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