TY - GEN
T1 - Malfunction suppression of semiconductor circuit breaker in high voltage DC power supply system
AU - Abe, Seiya
AU - Yang, Sihun
AU - Ogawa, Mariko
AU - Shoyama, Masahito
AU - Ninomiya, Tamotsu
AU - Matsumoto, Akira
AU - Fukui, Akiyoshi
AU - Yamasaki, Mikio
PY - 2010/12/1
Y1 - 2010/12/1
N2 - In high voltage DC power supply system (HVDC) system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction occurs, unexpected large current is flown to the other normal line. In this paper, the malfunction suppression of semiconductor circuit breaker is described. It demonstrated by using MATLAB/Simulink Moreover, the demonstrated results are confirmed by experimentally.
AB - In high voltage DC power supply system (HVDC) system, the fast response breaker is required. Semiconductor circuit breaker is paid attention as one of the key technology in HVDC. However, in some condition, the semiconductor circuit is malfunctioned. When malfunction occurs, unexpected large current is flown to the other normal line. In this paper, the malfunction suppression of semiconductor circuit breaker is described. It demonstrated by using MATLAB/Simulink Moreover, the demonstrated results are confirmed by experimentally.
UR - http://www.scopus.com/inward/record.url?scp=79951661733&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=79951661733&partnerID=8YFLogxK
U2 - 10.1109/TENCON.2010.5685956
DO - 10.1109/TENCON.2010.5685956
M3 - Conference contribution
AN - SCOPUS:79951661733
SN - 9781424468904
T3 - IEEE Region 10 Annual International Conference, Proceedings/TENCON
SP - 1278
EP - 1283
BT - TENCON 2010 - 2010 IEEE Region 10 Conference
T2 - 2010 IEEE Region 10 Conference, TENCON 2010
Y2 - 21 November 2010 through 24 November 2010
ER -