Measurement of dynamic retention with fast ejecting system of targeted sample (FESTA)

Qilin Yue, Kazuaki Hanada, Makoto Oya, Shogo Matsuo, Shinichiro Kojima, Hiroshi Idei, Takumi Onchi, Kengoh Kuroda, Naoaki Yoshida, Ryuya Ikezoe, Yukai Liu, Makoto Hasegawa, Shun Shimabukuro, Aki Higashijima, Takahiro Nagata, Shoji Kawasaki

Research output: Contribution to journalArticlepeer-review

Abstract

Fast Ejecting System of Targeted sAmple called FESTA has been developed to carry out the measurement of dynamic hydrogen retention by a test sample. A sample can be exposed and extracted from the targeted plasma at any time using FESTA, however, when exposing the sample, the test chamber wall gets coated by some hydrogen as it is open to the QUEST vacuum vessel. We refer to this as the plasma-induced background. To measure the amount of hydrogen retained by the sample itself, the contribution from the plasma induced background must be subtracted from the measurements. To measure the accurate dynamic retention from plasma-exposed sample, a background subtraction model has been developed and tested. The initial testing shows that the FESTA system and model can estimate the dynamic hydrogen retention by a target test sample.

Original languageEnglish
Pages (from-to)1-5
Number of pages5
JournalPlasma and Fusion Research
Volume15
DOIs
Publication statusPublished - 2020

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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