Measurement of in-plane magnetic relaxation in RE-123 coated conductors by use of scanning Hall probe microscopy

K. Shiohara, Kohei Higashikawa, Masayoshi Inoue, Takanobu Kiss, Y. Iijima, T. Saitoh, M. Yoshizumi, T. Izumi

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We have investigated electric field criterion of in-plane critical current density in a coated conductor characterized by scanning Hall-probe microscopy (SHPM). From remanent field distribution and its relaxation measurements, we could obtain critical current distribution and induced electric field simultaneously by considering the Biot-Savart law and the Faraday's law, respectively. These results lead us to evaluate a distribution of local critical current density and the corresponding criterion of electric field. As a result, it was found that the electric field criterion for the SHPM analysis was several orders lower than that used in the conventional 4-probe resistive method. However, the data point obtained by the SHPM shows good agreement with E-J curve analytically extended from the measurements by the 4-probe method. This means that we could characterize in-plane distribution of critical current density in a coated conductor at an electric field criterion quantitatively by this method in a nondestructive manner. These findings will be very important information since the uniformity of local critical current density in a coated conductor at extremely low electric fields is a key issue (1) especially for DC applications, (2) for quality control of coated conductors, and (3) for the standardization of the characterization of critical current among different methods.

Original languageEnglish
Pages (from-to)139-141
Number of pages3
JournalPhysica C: Superconductivity and its applications
Volume484
DOIs
Publication statusPublished - Jan 15 2013

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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