Measurement of local critical currents in TFA-MOD processed coated conductors by use of scanning Hall-probe microscopy

K. Shiohara, K. Higashikawa, T. Kawaguchi, M. Inoue, T. Kiss, M. Yoshizumi, T. Izumi

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

We have carried out 2-dimensional (2D) measurement of local critical current in a Trifluoroacetates-Metal Organic Deposition (TFA-MOD) processed YBCO coated conductor using scanning Hall-probe microscopy. Recently, remarkable R&D accomplishments on the fabrication processes of coated conductors have been conducted extensively and reported. The TFA-MOD process has been expected as an attractive process to produce coated conductors with high performance at a low production cost due to a simple process using non-vacuum equipments. On the other hand, enhancement of critical currents and homogenization of the critical current distribution in the coated conductors are definitely very important for practical applications. According to our measurements, we can detect positions and spatial distribution of defects in the conductor. This kind of information will be very helpful for the improvement of the TFA-MOD process and for the design of the conductor intended for practical electric power device applications.

Original languageEnglish
Pages (from-to)1041-1044
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume471
Issue number21-22
DOIs
Publication statusPublished - Nov 2011

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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