Measurement of local current flow around transverse defects in YBCO film by use of scanning SQUID microscope

K. Koyanagi, Takanobu Kiss, Masayoshi Inoue, T. Nakamura, K. Imamura, M. Takeo, Y. Shiohara

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Nonlinear current flow around artificial defects in YBCO epitaxial film has been investigated by use of scanning SQUID microscope. Two-dimensional local current flow around the transverse defects in the YBCO film has been visualized successfully from the magnetic self-field image. Experimental results showed good agreement with theoretical solution based on the Maxwell's equation along with nonlinear current-voltage characteristics. Present method allows us to measure the non-uniform current flow quantitatively under the influence of obstacles in the micro-meter length scale.

Original languageEnglish
Pages (from-to)677-681
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume445-448
Issue number1-2
DOIs
Publication statusPublished - Oct 1 2006

Fingerprint

SQUIDs
Microscopes
microscopes
Scanning
Defects
scanning
Epitaxial films
defects
Maxwell equations
Current voltage characteristics
Maxwell equation
electric potential

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Measurement of local current flow around transverse defects in YBCO film by use of scanning SQUID microscope. / Koyanagi, K.; Kiss, Takanobu; Inoue, Masayoshi; Nakamura, T.; Imamura, K.; Takeo, M.; Shiohara, Y.

In: Physica C: Superconductivity and its applications, Vol. 445-448, No. 1-2, 01.10.2006, p. 677-681.

Research output: Contribution to journalArticle

Koyanagi, K. ; Kiss, Takanobu ; Inoue, Masayoshi ; Nakamura, T. ; Imamura, K. ; Takeo, M. ; Shiohara, Y. / Measurement of local current flow around transverse defects in YBCO film by use of scanning SQUID microscope. In: Physica C: Superconductivity and its applications. 2006 ; Vol. 445-448, No. 1-2. pp. 677-681.
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