Measurement of Output Signals from an Avalanche Photodiode by Irradiating with X-rays in the Temperature Range from 150mK to 4.2K

Takashi Yasumune, Takuro Masuda, Yuki Oshima, Keisuke Maehata, Kenji Ishibashi, Takahiro Umeno

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We measured leakage current and gain characteristics of a reverse-type avalanche photodiode (APD). The leakage current generated below the breakdown voltage was found to be lower than 1 pA at temperatures below 200 K. Avalanche multiplication of the APD was achieved in the temperature range from 150mK to 300 K. To characterize charge carrier properties of the APD, output signal pulses from the APD were observed by irradiating the APD with X-rays in the temperature range from 150mK to 4.2 K. The yield of signal charge was found to abruptly change in the temperature range from 1 to 2 K, where the yield of charge at 1 K is about 50% of that at 2 K.

Original languageEnglish
Article number072201
JournalJapanese journal of applied physics
Volume50
Issue number7 PART 1
DOIs
Publication statusPublished - Jul 1 2011

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Avalanche photodiodes
avalanches
photodiodes
X rays
output
x rays
Leakage currents
Temperature
temperature
leakage
Electric breakdown
Charge carriers
electrical faults
multiplication
charge carriers
pulses

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Measurement of Output Signals from an Avalanche Photodiode by Irradiating with X-rays in the Temperature Range from 150mK to 4.2K. / Yasumune, Takashi; Masuda, Takuro; Oshima, Yuki; Maehata, Keisuke; Ishibashi, Kenji; Umeno, Takahiro.

In: Japanese journal of applied physics, Vol. 50, No. 7 PART 1, 072201, 01.07.2011.

Research output: Contribution to journalArticle

Yasumune, Takashi ; Masuda, Takuro ; Oshima, Yuki ; Maehata, Keisuke ; Ishibashi, Kenji ; Umeno, Takahiro. / Measurement of Output Signals from an Avalanche Photodiode by Irradiating with X-rays in the Temperature Range from 150mK to 4.2K. In: Japanese journal of applied physics. 2011 ; Vol. 50, No. 7 PART 1.
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