Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF

Junya Kuroda, Seiya Manabe, Yukinobu Watanabe, Kojiro Ito, Wang Liao, Masanori Hashimoto, Shin Ichiro Abe, Masahide Harada, Kenichi Oikawa, Yasuhiro Miyake

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science