Measurement of the BaTiO3 domain structure by using ultrahigh-vacuum atomic force microscopy (UHV-AFM)

Shigeru Kaku, Satoshi Miyauchi, Yukio Watanabe

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We report the nanoscopic properties of the clean, free surface of a BaTiO3 single crystal in an ultra-high vacuum. Atomic force microscopy, piezoelectric force microscopy and Kelvin force microscopy measurements show that the potential difference between upward and downward 180° domain is approx 100 mV. This value is 100 times smaller than the value estimated by using the standard 180° domain theory. Furthermore, our experiments show that this result cannot be explained only by the conventional explanations (that is, a decrease in the depolarization field by closure domains, the compensation of polarization bound charge by contamination or by oxygen excess and deficiency or ion transport). The results suggest a possibility that an intrinsic electrostatic shielding mechanism exists in the ferroelectrics and is essential for 180° domains.

Original languageEnglish
Pages (from-to)799-802
Number of pages4
JournalJournal of the Korean Physical Society
Volume55
Issue number2 PART 1
Publication statusPublished - Aug 1 2009

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ultrahigh vacuum
atomic force microscopy
electrostatic shielding
microscopy
depolarization
closures
contamination
single crystals
oxygen
polarization
ions

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Measurement of the BaTiO3 domain structure by using ultrahigh-vacuum atomic force microscopy (UHV-AFM). / Kaku, Shigeru; Miyauchi, Satoshi; Watanabe, Yukio.

In: Journal of the Korean Physical Society, Vol. 55, No. 2 PART 1, 01.08.2009, p. 799-802.

Research output: Contribution to journalArticle

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