Measurement of xenon plasma properties in an ion thruster using laser Thomson scattering technique

N. Yamamoto, K. Tomita, K. Sugita, T. Kurita, H. Nakashima, K. Uchino

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

This paper reports on the development of a method for measuring xenon plasma properties using the laser Thomson scattering technique, for application to ion engine system design. The thresholds of photo-ionization of xenon plasma were investigated and the number density of metastable atoms, which are photo-ionized by a probe laser, was measured using laser absorption spectroscopy, for several conditions. The measured threshold energy of the probe laser using a plano-convex lens with a focal length of 200 mm was 150 mJ for a xenon mass flow rate of 20 μgs and incident microwave power of 6 W; the probe laser energy was therefore set as 80 mJ. Electron number density was found to be (6.2 ± 0.4) × 10 17 m -3 and electron temperature was found to be 2.2 ± 0.4 eV at a xenon mass flow rate of 20 μgs and incident microwave power of 6 W. The threshold of the probe laser intensity against photo-ionization in a miniature xenon ion thruster is almost constant for various mass flow rates, since the ratio of population of the metastable atoms to the electron number density is little changed.

Original languageEnglish
Article number073106
JournalReview of Scientific Instruments
Volume83
Issue number7
DOIs
Publication statusPublished - Jul 1 2012

Fingerprint

Thomson scattering
Xenon
xenon
Scattering
mass flow rate
Plasmas
Lasers
Ions
Photoionization
metastable atoms
probes
lasers
Flow rate
ions
thresholds
photoionization
Ion engines
ion engines
Microwaves
microwaves

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

@article{3970a81770d942e0ac26809d7086cd3b,
title = "Measurement of xenon plasma properties in an ion thruster using laser Thomson scattering technique",
abstract = "This paper reports on the development of a method for measuring xenon plasma properties using the laser Thomson scattering technique, for application to ion engine system design. The thresholds of photo-ionization of xenon plasma were investigated and the number density of metastable atoms, which are photo-ionized by a probe laser, was measured using laser absorption spectroscopy, for several conditions. The measured threshold energy of the probe laser using a plano-convex lens with a focal length of 200 mm was 150 mJ for a xenon mass flow rate of 20 μgs and incident microwave power of 6 W; the probe laser energy was therefore set as 80 mJ. Electron number density was found to be (6.2 ± 0.4) × 10 17 m -3 and electron temperature was found to be 2.2 ± 0.4 eV at a xenon mass flow rate of 20 μgs and incident microwave power of 6 W. The threshold of the probe laser intensity against photo-ionization in a miniature xenon ion thruster is almost constant for various mass flow rates, since the ratio of population of the metastable atoms to the electron number density is little changed.",
author = "N. Yamamoto and K. Tomita and K. Sugita and T. Kurita and H. Nakashima and K. Uchino",
year = "2012",
month = "7",
day = "1",
doi = "10.1063/1.4737144",
language = "English",
volume = "83",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "7",

}

TY - JOUR

T1 - Measurement of xenon plasma properties in an ion thruster using laser Thomson scattering technique

AU - Yamamoto, N.

AU - Tomita, K.

AU - Sugita, K.

AU - Kurita, T.

AU - Nakashima, H.

AU - Uchino, K.

PY - 2012/7/1

Y1 - 2012/7/1

N2 - This paper reports on the development of a method for measuring xenon plasma properties using the laser Thomson scattering technique, for application to ion engine system design. The thresholds of photo-ionization of xenon plasma were investigated and the number density of metastable atoms, which are photo-ionized by a probe laser, was measured using laser absorption spectroscopy, for several conditions. The measured threshold energy of the probe laser using a plano-convex lens with a focal length of 200 mm was 150 mJ for a xenon mass flow rate of 20 μgs and incident microwave power of 6 W; the probe laser energy was therefore set as 80 mJ. Electron number density was found to be (6.2 ± 0.4) × 10 17 m -3 and electron temperature was found to be 2.2 ± 0.4 eV at a xenon mass flow rate of 20 μgs and incident microwave power of 6 W. The threshold of the probe laser intensity against photo-ionization in a miniature xenon ion thruster is almost constant for various mass flow rates, since the ratio of population of the metastable atoms to the electron number density is little changed.

AB - This paper reports on the development of a method for measuring xenon plasma properties using the laser Thomson scattering technique, for application to ion engine system design. The thresholds of photo-ionization of xenon plasma were investigated and the number density of metastable atoms, which are photo-ionized by a probe laser, was measured using laser absorption spectroscopy, for several conditions. The measured threshold energy of the probe laser using a plano-convex lens with a focal length of 200 mm was 150 mJ for a xenon mass flow rate of 20 μgs and incident microwave power of 6 W; the probe laser energy was therefore set as 80 mJ. Electron number density was found to be (6.2 ± 0.4) × 10 17 m -3 and electron temperature was found to be 2.2 ± 0.4 eV at a xenon mass flow rate of 20 μgs and incident microwave power of 6 W. The threshold of the probe laser intensity against photo-ionization in a miniature xenon ion thruster is almost constant for various mass flow rates, since the ratio of population of the metastable atoms to the electron number density is little changed.

UR - http://www.scopus.com/inward/record.url?scp=84866867192&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866867192&partnerID=8YFLogxK

U2 - 10.1063/1.4737144

DO - 10.1063/1.4737144

M3 - Article

C2 - 22852670

AN - SCOPUS:84866867192

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 7

M1 - 073106

ER -