Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

R. Holmestad, A. L. Weickenmeier, J. M. Zuo, J. C H Spence, Zenji Horita

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

Original languageEnglish
Pages (from-to)698-699
Number of pages2
JournalUnknown Journal
Publication statusPublished - 1993
Externally publishedYes

Fingerprint

Electrolytic polishing
simulation
energy
experiment
Experiments
method

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Holmestad, R., Weickenmeier, A. L., Zuo, J. M., Spence, J. C. H., & Horita, Z. (1993). Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. Unknown Journal, 698-699.

Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. / Holmestad, R.; Weickenmeier, A. L.; Zuo, J. M.; Spence, J. C H; Horita, Zenji.

In: Unknown Journal, 1993, p. 698-699.

Research output: Contribution to journalArticle

Holmestad, R, Weickenmeier, AL, Zuo, JM, Spence, JCH & Horita, Z 1993, 'Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities', Unknown Journal, pp. 698-699.
Holmestad R, Weickenmeier AL, Zuo JM, Spence JCH, Horita Z. Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. Unknown Journal. 1993;698-699.
Holmestad, R. ; Weickenmeier, A. L. ; Zuo, J. M. ; Spence, J. C H ; Horita, Zenji. / Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. In: Unknown Journal. 1993 ; pp. 698-699.
@article{fe73fd572a0f4fc595f6d839fffa30d5,
title = "Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities",
abstract = "A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.",
author = "R. Holmestad and Weickenmeier, {A. L.} and Zuo, {J. M.} and Spence, {J. C H} and Zenji Horita",
year = "1993",
language = "English",
pages = "698--699",
journal = "Quaternary International",
issn = "1040-6182",
publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

AU - Holmestad, R.

AU - Weickenmeier, A. L.

AU - Zuo, J. M.

AU - Spence, J. C H

AU - Horita, Zenji

PY - 1993

Y1 - 1993

N2 - A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

AB - A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

UR - http://www.scopus.com/inward/record.url?scp=0027705551&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027705551&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0027705551

SP - 698

EP - 699

JO - Quaternary International

JF - Quaternary International

SN - 1040-6182

ER -