A study was performed on the measurements of density fluctuations in reflectometry of cylindrical plasmas. A fluctuation reflectometry model capable of handling the plasma profiles of arbitrary shape and curvature was developed. The advantage of the analytical model was its simplicity and low consumption of computational resources.
|Number of pages||4|
|Journal||Review of Scientific Instruments|
|Issue number||3 II|
|Publication status||Published - Mar 2003|
|Event||Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics - Madison, WI, United States|
Duration: Jul 8 2002 → Jul 11 2002
All Science Journal Classification (ASJC) codes