Measurements of density fluctuations in reflectometry of cylindrical plasmas

L. G. Bruskin; N. Oyama; K. Shinohara; Y. Miura; Y. Kogi; A. Mase; M. Hasegawa; K. Hanada

doi:10.1063/1.1538355

Measurements of density fluctuations in reflectometry of cylindrical plasmas

L. G. Bruskin, N. Oyama, K. Shinohara, Y. Miura, Y. Kogi, A. Mase, M. Hasegawa, K. Hanada

Division of Nuclear Fusion Dynamics

Research output: Contribution to journal › Conference article › peer-review

6 Citations (Scopus)

Abstract

A study was performed on the measurements of density fluctuations in reflectometry of cylindrical plasmas. A fluctuation reflectometry model capable of handling the plasma profiles of arbitrary shape and curvature was developed. The advantage of the analytical model was its simplicity and low consumption of computational resources.

Original language	English
Pages (from-to)	1473-1476
Number of pages	4
Journal	Review of Scientific Instruments
Volume	74
Issue number	3 II
DOIs	https://doi.org/10.1063/1.1538355
Publication status	Published - Mar 2003
Event	Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics - Madison, WI, United States Duration: Jul 8 2002 → Jul 11 2002

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.1538355

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@article{c5be6f6e77ed4992b656f7f37b8cb5f3,

title = "Measurements of density fluctuations in reflectometry of cylindrical plasmas",

abstract = "A study was performed on the measurements of density fluctuations in reflectometry of cylindrical plasmas. A fluctuation reflectometry model capable of handling the plasma profiles of arbitrary shape and curvature was developed. The advantage of the analytical model was its simplicity and low consumption of computational resources.",

author = "Bruskin, {L. G.} and N. Oyama and K. Shinohara and Y. Miura and Y. Kogi and A. Mase and M. Hasegawa and K. Hanada",

note = "Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.; Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics ; Conference date: 08-07-2002 Through 11-07-2002",

year = "2003",

month = mar,

doi = "10.1063/1.1538355",

language = "English",

volume = "74",

pages = "1473--1476",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics Publising LLC",

number = "3 II",

}

TY - JOUR

T1 - Measurements of density fluctuations in reflectometry of cylindrical plasmas

AU - Bruskin, L. G.

AU - Oyama, N.

AU - Shinohara, K.

AU - Miura, Y.

AU - Kogi, Y.

AU - Mase, A.

AU - Hasegawa, M.

AU - Hanada, K.

PY - 2003/3

Y1 - 2003/3

N2 - A study was performed on the measurements of density fluctuations in reflectometry of cylindrical plasmas. A fluctuation reflectometry model capable of handling the plasma profiles of arbitrary shape and curvature was developed. The advantage of the analytical model was its simplicity and low consumption of computational resources.

AB - A study was performed on the measurements of density fluctuations in reflectometry of cylindrical plasmas. A fluctuation reflectometry model capable of handling the plasma profiles of arbitrary shape and curvature was developed. The advantage of the analytical model was its simplicity and low consumption of computational resources.

UR - http://www.scopus.com/inward/record.url?scp=0037351388&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037351388&partnerID=8YFLogxK

U2 - 10.1063/1.1538355

DO - 10.1063/1.1538355

M3 - Conference article

AN - SCOPUS:0037351388

VL - 74

SP - 1473

EP - 1476

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 3 II

T2 - Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics

Y2 - 8 July 2002 through 11 July 2002

ER -

Measurements of density fluctuations in reflectometry of cylindrical plasmas

Abstract

All Science Journal Classification (ASJC) codes

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