Measuring the thermal boundary resistance of van der Waals contacts using an individual carbon nanotube

Jun Hirotani, Tatsuya Ikuta, Takashi Nishiyama, Koji Takahashi

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Interfacial thermal transport via van der Waals interaction is quantitatively evaluated using an individual multi-walled carbon nanotube bonded on a platinum hot-film sensor. The thermal boundary resistance per unit contact area was obtained at the interface between the closed end or sidewall of the nanotube and platinum, gold, or a silicon dioxide surface. When taking into consideration the surface roughness, the thermal boundary resistance at the sidewall is found to coincide with that at the closed end. A new finding is that the thermal boundary resistance between a carbon nanotube and a solid surface is independent of the materials within the experimental errors, which is inconsistent with a traditional phonon mismatch model, which shows a clear material dependence of the thermal boundary resistance. Our data indicate the inapplicability of existing phonon models when weak van der Waals forces are dominant at the interfaces.

Original languageEnglish
Article number025301
JournalJournal of Physics Condensed Matter
Volume25
Issue number2
DOIs
Publication statusPublished - Jan 16 2013

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

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