Abstract
The surfaces of cured polyimide films, subjected to different buffing and cure profiles, have been examined by atomic force microscopy (AFM). The magnitude of a local stress applied to a polymer surface during buffing was estimated by imaging the surface tracks of buffing polymer fibers. Combining these experiments with a study of alignment characteristics of liquid crystals shows that the liquid crystal alignment is mainly caused by the oriented polymer chains which are formed most likely by the plastic deformation under the buffing stress
Original language | English |
---|---|
Title of host publication | Annual Technical Conference - ANTEC, Conference Proceedings |
Publisher | Soc of Plastics Engineers |
Pages | 2621-2622 |
Number of pages | 2 |
Volume | 2 |
Publication status | Published - 1995 |
Externally published | Yes |
Event | Proceedings of the 53rd Annual Technical Conference. Part 1 (of 3) - Boston, MA, USA Duration: May 7 1995 → Oct 11 1995 |
Other
Other | Proceedings of the 53rd Annual Technical Conference. Part 1 (of 3) |
---|---|
City | Boston, MA, USA |
Period | 5/7/95 → 10/11/95 |
All Science Journal Classification (ASJC) codes
- Engineering(all)