Mechanisms of liquid crystal alignment on buffed polyimide surfaces

Hirotsugu Kikuchi, J. A. Logan, D. Y. Yoon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The surfaces of cured polyimide films, subjected to different buffing and cure profiles, have been examined by atomic force microscopy (AFM). The magnitude of a local stress applied to a polymer surface during buffing was estimated by imaging the surface tracks of buffing polymer fibers. Combining these experiments with a study of alignment characteristics of liquid crystals shows that the liquid crystal alignment is mainly caused by the oriented polymer chains which are formed most likely by the plastic deformation under the buffing stress

Original languageEnglish
Title of host publicationAnnual Technical Conference - ANTEC, Conference Proceedings
PublisherSoc of Plastics Engineers
Pages2621-2622
Number of pages2
Volume2
Publication statusPublished - 1995
Externally publishedYes
EventProceedings of the 53rd Annual Technical Conference. Part 1 (of 3) - Boston, MA, USA
Duration: May 7 1995Oct 11 1995

Other

OtherProceedings of the 53rd Annual Technical Conference. Part 1 (of 3)
CityBoston, MA, USA
Period5/7/9510/11/95

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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