Micro-photoluminescence mapping of light emissions from aluminum-coated InGaN/GaN quantum wells

Kazutaka Tateishi, Pangpang Wang, Sou Ryuzaki, Mitsuru Funato, Yoichi Kawakami, Koichi Okamoto, Kaoru Tamada

Research output: Contribution to journalArticle

Abstract

Micro-photoluminescence (PL) mapping was investigated for Al-coated InGaN/GaN quantum wells (QWs), which showed huge PL enhancement by the surface plasmon (SP) resonance. The obtained images show inhomogeneity at the micro-meter scale; in addition, the region with lower PL intensities tend to have a longer PL wavelength for bare QWs. This correlation changed with an Al coating, positive correlations were observed in an area with a relatively short peak wavelength with blue-shift. Conversely, negative correlations were observed at longer peak wavelengths. These results suggest that the quantum-confined Stark effect (QCSE) was screened by the enhanced electrical-field of the SP resonance.

Original languageEnglish
Article number052016
JournalApplied Physics Express
Volume12
Issue number5
DOIs
Publication statusPublished - Jan 1 2019

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Light emission
Semiconductor quantum wells
light emission
Photoluminescence
quantum wells
aluminum
Aluminum
photoluminescence
Surface plasmon resonance
surface plasmon resonance
Wavelength
wavelengths
Stark effect
blue shift
inhomogeneity
coatings
Coatings
augmentation

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Micro-photoluminescence mapping of light emissions from aluminum-coated InGaN/GaN quantum wells. / Tateishi, Kazutaka; Wang, Pangpang; Ryuzaki, Sou; Funato, Mitsuru; Kawakami, Yoichi; Okamoto, Koichi; Tamada, Kaoru.

In: Applied Physics Express, Vol. 12, No. 5, 052016, 01.01.2019.

Research output: Contribution to journalArticle

Tateishi, Kazutaka ; Wang, Pangpang ; Ryuzaki, Sou ; Funato, Mitsuru ; Kawakami, Yoichi ; Okamoto, Koichi ; Tamada, Kaoru. / Micro-photoluminescence mapping of light emissions from aluminum-coated InGaN/GaN quantum wells. In: Applied Physics Express. 2019 ; Vol. 12, No. 5.
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