Microstructure analysis of β-FeSi2 grown on Ag-coated Si(001) substrate

Shunichi Motomura, Kohei Hayashi, Masaru Itakura, Kensuke Akiyama

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3 Citations (Scopus)

Abstract

Microstructure of epitaxial β-FeSi2 crystalline film grown on Ag-coated Si (001) substrate was investigated with scanning electron microscope (SEM) and transmission electron microscopes (TEMs). It was found that the film consists of two types of β-FeSi2 grains, or rod-like polygonal and thin platelet grains. The platelet grains are connected mutually to form large continuous-film areas on the Si(001) substrate. The crystallographic orientation relationship obtained is: β-FeSi2(100)[011]//Si(001)[110], which is a rare epitaxial relationship. However, the interface between the platelet grains and the Si substrate is very flat at an atomic level. Moreover, remains of Ag impurities are not detected in the β-FeSi2 grains. These results indicate that the continuous crystalline film consisting of high quality β-FeSi2 crystals can be produced by using Ag-coated Si(001) substrate.

Original languageEnglish
Pages (from-to)1815-1818
Number of pages4
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume10
Issue number12
DOIs
Publication statusPublished - Dec 2013

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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