Microstructure and field angle dependence of critical current densities in REBa 2Cu 3O y thin films prepared by PLD method

Y. Ichino, R. Honda, M. Miura, M. Itoh, Y. Yoshida, Y. Takai, K. Matsumoto, Masashi Mukaida, A. Ichinose, S. Horii

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A c-axis oriented epitaxial REBa 2Cu 3O y (RE123) thin film performs excellent superconducting properties in magnetic field. Recently, we reported that a critical current density (J c) in the RE123 thin film was improved by a deliberate composition control. A Sm 1+xBa 2-xCu 3O y (Sm123) thin film with a small amount of Sm/Ba substitution x showed the great J c ∼ 0.17 MA/cm 2 in 5 T at 77.3 K, while the J c in (Yb 1-zNd z)Ba 2Cu 3O y (Yb/Nd123) thin films depended on an amount of mixed crystal ratio z. In this report, we studied J c as a function of magnetic field and field orientation with respect to ab-planes. In low magnetic field, the J c of Sm123 thin film was almost independent of the applied angle of the field. In the case of Yb/Nd123 thin film, extremely high J c were observed when the magnetic field was aligned parallel or perpendicular to the surface of the film. Because compositional fluctuations in RE123 thin films were observed by transmission electron microscopy, we found that the pinning centers in RE123 thin films are strongly affected by the composition in the thin films.

Original languageEnglish
Pages (from-to)3730-3733
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume15
Issue number2 PART III
DOIs
Publication statusPublished - Jun 1 2005

Fingerprint

Pulsed laser deposition
critical current
current density
Thin films
microstructure
Microstructure
thin films
Magnetic fields
magnetic fields
1-dodecylpyridoxal
mixed crystals
Chemical analysis
Substitution reactions
substitutes
Transmission electron microscopy
transmission electron microscopy
Crystals

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Microstructure and field angle dependence of critical current densities in REBa 2Cu 3O y thin films prepared by PLD method. / Ichino, Y.; Honda, R.; Miura, M.; Itoh, M.; Yoshida, Y.; Takai, Y.; Matsumoto, K.; Mukaida, Masashi; Ichinose, A.; Horii, S.

In: IEEE Transactions on Applied Superconductivity, Vol. 15, No. 2 PART III, 01.06.2005, p. 3730-3733.

Research output: Contribution to journalArticle

Ichino, Y, Honda, R, Miura, M, Itoh, M, Yoshida, Y, Takai, Y, Matsumoto, K, Mukaida, M, Ichinose, A & Horii, S 2005, 'Microstructure and field angle dependence of critical current densities in REBa 2Cu 3O y thin films prepared by PLD method', IEEE Transactions on Applied Superconductivity, vol. 15, no. 2 PART III, pp. 3730-3733. https://doi.org/10.1109/TASC.2005.849416
Ichino, Y. ; Honda, R. ; Miura, M. ; Itoh, M. ; Yoshida, Y. ; Takai, Y. ; Matsumoto, K. ; Mukaida, Masashi ; Ichinose, A. ; Horii, S. / Microstructure and field angle dependence of critical current densities in REBa 2Cu 3O y thin films prepared by PLD method. In: IEEE Transactions on Applied Superconductivity. 2005 ; Vol. 15, No. 2 PART III. pp. 3730-3733.
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