TY - JOUR
T1 - Microstructure evolution in 200-MeV Xe ion irradiated CeO2doped with Gd2O3
AU - Seo, Pooreun
AU - Yasuda, Kazuhiro
AU - Matsumura, Syo
AU - Ishikawa, Norito
AU - Gutierrez, Gaëlle
AU - Costantini, Jean Marc
N1 - Funding Information:
Ion irradiation experiments were carried out at the tandem accelerator of Japan Atomic Energy Agency under the support of the Inter-organizational Atomic Energy Research Program. XRD and TEM experiments were done at the Center for Advanced Instrumental Analysis and the Ultramicroscopy Research Center of Kyushu University, respectively. This work was supported in part by Japan Society for the Promotion of Science (JSPS) KAKENHI with Grant Nos. JP19K05333 and JP21J13575.
Publisher Copyright:
© 2022 Author(s).
PY - 2022/12/21
Y1 - 2022/12/21
N2 - The microstructure of virgin and heavy ion-irradiated Ce1-xGdxO2-x/2 with a wide range of Gd dopant concentrations (0 ≤ xGd ≤ 0.5) was evaluated by x-ray diffraction (XRD), micro-Raman spectroscopy, and transmission electron microscopy (TEM) for selected area electron diffraction (SAED) analysis and plane-view bright-field (BF) imaging of ion tracks. The Ce1-xGdxO2-x/2 samples were irradiated with 200-MeV Xe14+ ions up to fluences from 3 × 1011 to 1 × 1013 cm-2 at ambient temperature. XRD patterns of the virgin Ce1-xGdxO2-x/2 samples showed saturation of lattice parameter and relaxation of microstrain in Ce1-xGdxO2-x/2 which are attributed to the increasing Gd concentration. Moreover, micro-Raman spectroscopy and SAED patterns revealed the bixbyite (C-type) structure formation and oxygen vacancy ordering for xGd > 0.2 that is induced by dispersed C-type domains in the fluorite-structured (F-type) matrix. In the irradiated samples, asymmetric XRD peaks induced by lattice distortion were observed together with ion tracks in BF-TEM images. The radiation damage was recovered with the increase of Gd concentration. There is a rapid reduction of radiation damage cross section for xGd > 0.2 with a reduction of the C-type structure reflections in XRD and SAED patterns.
AB - The microstructure of virgin and heavy ion-irradiated Ce1-xGdxO2-x/2 with a wide range of Gd dopant concentrations (0 ≤ xGd ≤ 0.5) was evaluated by x-ray diffraction (XRD), micro-Raman spectroscopy, and transmission electron microscopy (TEM) for selected area electron diffraction (SAED) analysis and plane-view bright-field (BF) imaging of ion tracks. The Ce1-xGdxO2-x/2 samples were irradiated with 200-MeV Xe14+ ions up to fluences from 3 × 1011 to 1 × 1013 cm-2 at ambient temperature. XRD patterns of the virgin Ce1-xGdxO2-x/2 samples showed saturation of lattice parameter and relaxation of microstrain in Ce1-xGdxO2-x/2 which are attributed to the increasing Gd concentration. Moreover, micro-Raman spectroscopy and SAED patterns revealed the bixbyite (C-type) structure formation and oxygen vacancy ordering for xGd > 0.2 that is induced by dispersed C-type domains in the fluorite-structured (F-type) matrix. In the irradiated samples, asymmetric XRD peaks induced by lattice distortion were observed together with ion tracks in BF-TEM images. The radiation damage was recovered with the increase of Gd concentration. There is a rapid reduction of radiation damage cross section for xGd > 0.2 with a reduction of the C-type structure reflections in XRD and SAED patterns.
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U2 - 10.1063/5.0121951
DO - 10.1063/5.0121951
M3 - Article
AN - SCOPUS:85144618119
VL - 132
JO - Journal of Applied Physics
JF - Journal of Applied Physics
SN - 0021-8979
IS - 23
M1 - 235902
ER -