A novel inverse scattering approach is developed to the reconstruction of electrical property distributions of a two-dimensional biaxial anisotropic object using time-domain scattering data. The approach is an extension of the forward-backward time-stepping (FBTS) algorithm previously described for an isotropic object. Synthetic examples of inversion are given to assess the effectiveness of the proposed method.
|Number of pages||7|
|Journal||IEICE Transactions on Electronics|
|Publication status||Published - Jan 1 2001|
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering