Microwave surface resistance of YBCO thin films on cerium oxide buffer

M. Kusunoki, T. Suto, D. Okai, Y. Takano, Masashi Mukaida, S. Ohshima

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

The effects of the crystallinity and surface roughness of CeOz buffer on It-plane A1}O3 substrate on the microwave surface resistance (RJ of YBBjCUjO YBCO) thin films are discussed. We estimated Rf from the transmission characteristics of the microstrip line resonator at 25 K and 6.7 GHz. X-ray diffraction (XRD) of 6-26 and -scan showed that CeO, was completely (OOl)-oriented and in-plane aligned crystal Four CeO: samples with different thicknesses were prepared nsing identical conditions except for the deposition time. The dependence of Rf on CeO, thickness was measured in the range from 10 nm to 200 nm. The value of Rt was minimum at CeO2 thickness of 100 nm. The dependence of A( vs CeO2 thickness was similar to that of the amount of a-axis domains against the thickness. The crystallinity of thin CeOj was poor because the lattice was strongly strained by A12O3. This affected the quality of the upper YBCO layer. In contrast, thick CeO2 had excellent crystallinity. However, for the thickness of more than 100 nm a drastic change in surface morphology was observed by atomic force microscopy (AFM). A number of projections appeared on the CeO,surface. These projections act as nucleation centers for the a-axis domains.

Original languageEnglish
Pages (from-to)1932-1935
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume9
Issue number2 PART 2
DOIs
Publication statusPublished - Dec 1 1999

Fingerprint

cerium oxides
Surface resistance
Microstrip lines
Cerium
Surface morphology
Resonators
Atomic force microscopy
Buffers
Nucleation
buffers
Surface roughness
Microwaves
microwaves
X ray diffraction
Thin films
Crystals
Oxides
Substrates
thin films
crystallinity

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Microwave surface resistance of YBCO thin films on cerium oxide buffer. / Kusunoki, M.; Suto, T.; Okai, D.; Takano, Y.; Mukaida, Masashi; Ohshima, S.

In: IEEE Transactions on Applied Superconductivity, Vol. 9, No. 2 PART 2, 01.12.1999, p. 1932-1935.

Research output: Contribution to journalArticle

Kusunoki, M. ; Suto, T. ; Okai, D. ; Takano, Y. ; Mukaida, Masashi ; Ohshima, S. / Microwave surface resistance of YBCO thin films on cerium oxide buffer. In: IEEE Transactions on Applied Superconductivity. 1999 ; Vol. 9, No. 2 PART 2. pp. 1932-1935.
@article{1925a80722184457b30142a2ad963a07,
title = "Microwave surface resistance of YBCO thin films on cerium oxide buffer",
abstract = "The effects of the crystallinity and surface roughness of CeOz buffer on It-plane A1}O3 substrate on the microwave surface resistance (RJ of YBBjCUjO YBCO) thin films are discussed. We estimated Rf from the transmission characteristics of the microstrip line resonator at 25 K and 6.7 GHz. X-ray diffraction (XRD) of 6-26 and -scan showed that CeO, was completely (OOl)-oriented and in-plane aligned crystal Four CeO: samples with different thicknesses were prepared nsing identical conditions except for the deposition time. The dependence of Rf on CeO, thickness was measured in the range from 10 nm to 200 nm. The value of Rt was minimum at CeO2 thickness of 100 nm. The dependence of A( vs CeO2 thickness was similar to that of the amount of a-axis domains against the thickness. The crystallinity of thin CeOj was poor because the lattice was strongly strained by A12O3. This affected the quality of the upper YBCO layer. In contrast, thick CeO2 had excellent crystallinity. However, for the thickness of more than 100 nm a drastic change in surface morphology was observed by atomic force microscopy (AFM). A number of projections appeared on the CeO,surface. These projections act as nucleation centers for the a-axis domains.",
author = "M. Kusunoki and T. Suto and D. Okai and Y. Takano and Masashi Mukaida and S. Ohshima",
year = "1999",
month = "12",
day = "1",
doi = "10.1109/77.784838",
language = "English",
volume = "9",
pages = "1932--1935",
journal = "IEEE Transactions on Applied Superconductivity",
issn = "1051-8223",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2 PART 2",

}

TY - JOUR

T1 - Microwave surface resistance of YBCO thin films on cerium oxide buffer

AU - Kusunoki, M.

AU - Suto, T.

AU - Okai, D.

AU - Takano, Y.

AU - Mukaida, Masashi

AU - Ohshima, S.

PY - 1999/12/1

Y1 - 1999/12/1

N2 - The effects of the crystallinity and surface roughness of CeOz buffer on It-plane A1}O3 substrate on the microwave surface resistance (RJ of YBBjCUjO YBCO) thin films are discussed. We estimated Rf from the transmission characteristics of the microstrip line resonator at 25 K and 6.7 GHz. X-ray diffraction (XRD) of 6-26 and -scan showed that CeO, was completely (OOl)-oriented and in-plane aligned crystal Four CeO: samples with different thicknesses were prepared nsing identical conditions except for the deposition time. The dependence of Rf on CeO, thickness was measured in the range from 10 nm to 200 nm. The value of Rt was minimum at CeO2 thickness of 100 nm. The dependence of A( vs CeO2 thickness was similar to that of the amount of a-axis domains against the thickness. The crystallinity of thin CeOj was poor because the lattice was strongly strained by A12O3. This affected the quality of the upper YBCO layer. In contrast, thick CeO2 had excellent crystallinity. However, for the thickness of more than 100 nm a drastic change in surface morphology was observed by atomic force microscopy (AFM). A number of projections appeared on the CeO,surface. These projections act as nucleation centers for the a-axis domains.

AB - The effects of the crystallinity and surface roughness of CeOz buffer on It-plane A1}O3 substrate on the microwave surface resistance (RJ of YBBjCUjO YBCO) thin films are discussed. We estimated Rf from the transmission characteristics of the microstrip line resonator at 25 K and 6.7 GHz. X-ray diffraction (XRD) of 6-26 and -scan showed that CeO, was completely (OOl)-oriented and in-plane aligned crystal Four CeO: samples with different thicknesses were prepared nsing identical conditions except for the deposition time. The dependence of Rf on CeO, thickness was measured in the range from 10 nm to 200 nm. The value of Rt was minimum at CeO2 thickness of 100 nm. The dependence of A( vs CeO2 thickness was similar to that of the amount of a-axis domains against the thickness. The crystallinity of thin CeOj was poor because the lattice was strongly strained by A12O3. This affected the quality of the upper YBCO layer. In contrast, thick CeO2 had excellent crystallinity. However, for the thickness of more than 100 nm a drastic change in surface morphology was observed by atomic force microscopy (AFM). A number of projections appeared on the CeO,surface. These projections act as nucleation centers for the a-axis domains.

UR - http://www.scopus.com/inward/record.url?scp=0032663528&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032663528&partnerID=8YFLogxK

U2 - 10.1109/77.784838

DO - 10.1109/77.784838

M3 - Article

AN - SCOPUS:0032663528

VL - 9

SP - 1932

EP - 1935

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

SN - 1051-8223

IS - 2 PART 2

ER -