Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y

Yukio Watanabe, Z. Z. Wang, S. A. Lyon, D. C. Tsui, N. P. Ong, J. M. Tarascon, P. Barboux

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

We have measured the room-temperature reflectivity of 90-K single crystals YBa2Cu3O7 in the frequency range 6009000 cm-1. The reflectivity R in these highly conducting samples (ab=150 cm at 290 K) is found to be higher than in previous reports. We fit R to a simple Drude-Lorentz model and compare the fit parameters with the dc transport values. (The effective-mass ratio of the carriers is found to be 2.0, and the scattering rate Latin small letter h with stroke/ is 3.1kBT at room temperature.) Ellipsometry measurements have also been performed using transverse-electric and transverse-magnetic polarizations. The dielectric dispersion derived from ellipsometry shows some important deviations from the Drude-Lorentz model. Reflectivity data from nonsuperconducting crystals of Bi2Sr2CuO6+y are also reported.

Original languageEnglish
Pages (from-to)6884-6889
Number of pages6
JournalPhysical Review B
Volume40
Issue number10
DOIs
Publication statusPublished - Jan 1 1989
Externally publishedYes

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ellipsometry
reflectance
single crystals
room temperature
strokes
mass ratios
frequency ranges
deviation
conduction
polarization
scattering
crystals

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

Watanabe, Y., Wang, Z. Z., Lyon, S. A., Tsui, D. C., Ong, N. P., Tarascon, J. M., & Barboux, P. (1989). Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y. Physical Review B, 40(10), 6884-6889. https://doi.org/10.1103/PhysRevB.40.6884

Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y. / Watanabe, Yukio; Wang, Z. Z.; Lyon, S. A.; Tsui, D. C.; Ong, N. P.; Tarascon, J. M.; Barboux, P.

In: Physical Review B, Vol. 40, No. 10, 01.01.1989, p. 6884-6889.

Research output: Contribution to journalArticle

Watanabe, Yukio ; Wang, Z. Z. ; Lyon, S. A. ; Tsui, D. C. ; Ong, N. P. ; Tarascon, J. M. ; Barboux, P. / Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y. In: Physical Review B. 1989 ; Vol. 40, No. 10. pp. 6884-6889.
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