Modeling on debonding dynamics of pressure-sensitive adhesives

Tetsuo Yamaguchi, H. Morita, M. Doi

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

We propose a simple mechanical model describing viscoelasticity and cavitation during the debonding process in pressure-sensitive adhesives (PSA). Our calculation qualitatively reproduces typical stress-strain curves in the probe-tack test, such as the steep stress maxima and the following plateau region. It is shown that in the thin-film geometry the stress-strain curve is essentially determined by the cavities created by the large negative pressure. Effects of pre-existent air bubbles due to surface roughness are also discussed.

Original languageEnglish
Pages (from-to)7-17
Number of pages11
JournalEuropean Physical Journal E
Volume20
Issue number1
DOIs
Publication statusPublished - May 1 2006
Externally publishedYes

Fingerprint

Debonding
Stress-strain curves
Adhesives
adhesives
Pressure
Viscoelasticity
Cavitation
Surface roughness
Air
viscoelasticity
curves
cavitation flow
Thin films
Geometry
plateaus
surface roughness
bubbles
cavities
probes
air

All Science Journal Classification (ASJC) codes

  • Biotechnology
  • Biophysics
  • Chemistry(all)
  • Materials Science(all)
  • Surfaces and Interfaces

Cite this

Modeling on debonding dynamics of pressure-sensitive adhesives. / Yamaguchi, Tetsuo; Morita, H.; Doi, M.

In: European Physical Journal E, Vol. 20, No. 1, 01.05.2006, p. 7-17.

Research output: Contribution to journalArticle

@article{9c6de867df674bae9f89a6df9713fab2,
title = "Modeling on debonding dynamics of pressure-sensitive adhesives",
abstract = "We propose a simple mechanical model describing viscoelasticity and cavitation during the debonding process in pressure-sensitive adhesives (PSA). Our calculation qualitatively reproduces typical stress-strain curves in the probe-tack test, such as the steep stress maxima and the following plateau region. It is shown that in the thin-film geometry the stress-strain curve is essentially determined by the cavities created by the large negative pressure. Effects of pre-existent air bubbles due to surface roughness are also discussed.",
author = "Tetsuo Yamaguchi and H. Morita and M. Doi",
year = "2006",
month = "5",
day = "1",
doi = "10.1140/epje/i2005-10078-6",
language = "English",
volume = "20",
pages = "7--17",
journal = "European Physical Journal E",
issn = "1292-8941",
publisher = "Springer New York",
number = "1",

}

TY - JOUR

T1 - Modeling on debonding dynamics of pressure-sensitive adhesives

AU - Yamaguchi, Tetsuo

AU - Morita, H.

AU - Doi, M.

PY - 2006/5/1

Y1 - 2006/5/1

N2 - We propose a simple mechanical model describing viscoelasticity and cavitation during the debonding process in pressure-sensitive adhesives (PSA). Our calculation qualitatively reproduces typical stress-strain curves in the probe-tack test, such as the steep stress maxima and the following plateau region. It is shown that in the thin-film geometry the stress-strain curve is essentially determined by the cavities created by the large negative pressure. Effects of pre-existent air bubbles due to surface roughness are also discussed.

AB - We propose a simple mechanical model describing viscoelasticity and cavitation during the debonding process in pressure-sensitive adhesives (PSA). Our calculation qualitatively reproduces typical stress-strain curves in the probe-tack test, such as the steep stress maxima and the following plateau region. It is shown that in the thin-film geometry the stress-strain curve is essentially determined by the cavities created by the large negative pressure. Effects of pre-existent air bubbles due to surface roughness are also discussed.

UR - http://www.scopus.com/inward/record.url?scp=33744743264&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33744743264&partnerID=8YFLogxK

U2 - 10.1140/epje/i2005-10078-6

DO - 10.1140/epje/i2005-10078-6

M3 - Article

C2 - 16733634

AN - SCOPUS:33744743264

VL - 20

SP - 7

EP - 17

JO - European Physical Journal E

JF - European Physical Journal E

SN - 1292-8941

IS - 1

ER -