In this study, structural features of crystalline polymers at the solid surface were analyzed by synchrotron grazing-incidence X-ray diffraction (SR-GIXD) measurements. Thin films of high-density polyethylene (HDPE) were prepared on silicon substrates from a p-xylene solution by a dip-coating method. The dip-coated films and the dip-coated and melt-crystallized ones were annealed at temperatures (Ta) of 373K-393K under N 2 atmosphere. The in-plane GIXD measurement for the HDPE thin films was carried out at the BL13XU of SPring-8, Japan. Bragg diffraction from the near-surface and the bulk of the films was detected at incident angles smaller and larger than the critical angle, respectively. Comparison of the surface-sensitive GIXD data with the bulk one revealed that the dimensions of orthorhombic unit cell in the near-surface region were smaller than those in the bulk region. This might relate to thermal stress induced between the HDPE film and the silicon substrate in film preparation.
|Number of pages||2|
|Publication status||Published - Dec 1 2005|
|Event||54th SPSJ Symposium on Macromolecules - Yamagata, Japan|
Duration: Sep 20 2005 → Sep 22 2005
|Other||54th SPSJ Symposium on Macromolecules|
|Period||9/20/05 → 9/22/05|
All Science Journal Classification (ASJC) codes