Molecular design of hole transport materials for obtaining high durability in organic electroluminescent diodes

Chihaya Adachi, Kazukiyo Nagai, Nozomu Tamoto

Research output: Contribution to journalArticlepeer-review

420 Citations (Scopus)

Abstract

The molecular design of hole transport materials (HTMs) for producing high durability in organic layered electroluminescent (EL) diodes was elucidated. The durability tests were examined using fourteen hole transport materials in the cell structure of an anode/hole transport layer (HTL)/emitter layer (EML)/cathode. The ionization potential (Ip) of HTLs was found to be the dominant factor for obtaining high durability in organic EL devices. The formation of the small energy barrier at the interface of a HTL/anode was required for high durability. Moreover, no straightforward relations between melting point, glass transition temperature of the HTMs, and durability of the EL devices were observed. The EL device using the HTM having a low Ip (5.08 eV) showed an especially remarkable stability. In this case, the half-life period of the initial luminance was beyond 500 h.

Original languageEnglish
Pages (from-to)2679
Number of pages1
JournalApplied Physics Letters
DOIs
Publication statusPublished - 1995
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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