Multilayer mirror soft x-ray spectrometer for fast electron temperature measurement on the compact helical system

S. Lee, S. Duorah, A. Ejiri, H. Iguchi, A. Fujisawa, E. Ishiyama, Y. Takase, H. Toyama, M. Aramaki, M. Kojima, S. Okamura, K. Matsuoka

Research output: Contribution to journalArticle

Abstract

A multilayer mirror (MLM) soft x-ray spectrometer has been installed on the Compact Helical System. The x-ray energy spectrum from ECH and neutral beam injected heated low beta plasmas was measured as a function of radiation energy. Modulations of the x-ray intensity associated with magnetohydrodynamic instability were observed. The electron temperature measurement was also investigated using the MLM x-ray spectrometer. The data suggest the possibility of a fluctuation measurement of the electron temperature Te with fast time resolution using the MLM spectrometer.

Original languageEnglish
Pages (from-to)1671-1674
Number of pages4
JournalReview of Scientific Instruments
Volume71
Issue number4
DOIs
Publication statusPublished - Apr 2000
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Instrumentation

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