Multiple sensitive volume based soft error rate estimation with machine learning

Soichi Hirokawa, Ryo Harada, Kenshiro Sakuta, Yukinobu Watanabe, Masanori Hashimoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

We propose a new methodology for soft error rate estimation using multiple sensitive volumes and machine learning. The proposed methodology assigns multiple sensitive volumes to a unit circuit (e.g. SRAM cell) and constructs a discriminator from TCAD simulations by machine learning. For each ion reproduced by radiation transport simulation, the discriminator judges whether an upset occurs or not, and consequently we can obtain soft error rate by counting the number of events judged as upset events. Advantages of the proposed methodology are: (1) empirical construction and adjustment of sensitive volume and critical charge is no longer necessary, (2) multiple transistors can be easily considered, and (3) event-wise accuracy can be improved. We confirmed the correlation between irradiation results and simulation results for 65-nm silicon on thin buried oxide (SOTB) SRAM. The estimation error was 7% without any empirical optimization of sensitive volume and critical charge.

Original languageEnglish
Title of host publication2016 16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781509043668
DOIs
Publication statusPublished - Oct 31 2017
Event16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016 - Bremen, Germany
Duration: Sep 19 2016Sep 23 2016

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Volume2016-September

Other

Other16th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2016
CountryGermany
CityBremen
Period9/19/169/23/16

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Radiation

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